Hard X-ray nano-interferometer and its application to high-spatial- resolution phase tomography

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 45, Issue 42-45, 2006, Pages

  Koyama, Takahisa ^a   Tsuji, Takuya ^a   Yoshida, Keisuke ^a   Takano, Hidekazu ^a   Tsusaka, Yoshiyuki ^a   Kagoshima, Yasushi ^a  

^a UNIVERSITY OF HYOGO   (Japan)

Author keywords

Fringe scanning method; Phase contrast; Phase retrieval; Phase tomography; Synchrotron radiation; X ray interferometer; X ray microscopy; Zone plate

Indexed keywords

NANOTECHNOLOGY; OPTICAL RESOLVING POWER; PHASE SEPARATION; POLYSTYRENES; SYNCHROTRON RADIATION; X RAY MICROSCOPES;

FRINGE SCANNING METHODS; PHASE CONTRAST; PHASE RETRIEVAL; PHASE TOMOGRAPHY; X-RAY INTERFEROMETERS; ZONE PLATES;

INTERFEROMETRY;

EID: 34548718794     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.45.L1159     Document Type: Article

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