Sensitivity of X-ray phase imaging based on Talbot interferometry

Japanese Journal of Applied Physics

Volumn 47, Issue 10 PART 1, 2008, Pages 8077-8080

  Momose, Atsushi ^a   Yashiro, Wataru ^a   Takeda, Yoshihiro ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

Grating; Sensitivity; Talbot interferometer; Talbot Lau interferometer; X ray phase contrast

Indexed keywords

ABSORPTION; IMAGE RESOLUTION; INTERFEROMETRY; X RAYS;

GRATING; SENSITIVITY; TALBOT INTERFEROMETER; TALBOT-LAU INTERFEROMETER; X-RAY PHASE CONTRAST;

INTERFEROMETERS;

EID: 62249168832     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.47.8077     Document Type: Article

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