A new post-silicon debug approach based on suspect window

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2009, Pages 85-90

  Gao, Jianliang ^a,b   Han, Yinhe ^a   Li, Xiaowei ^a  

^a INSTITUTE OF COMPUTING TECHNOLOGY   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

Author keywords

Bug; Post silicon debug; Scan; Suspect window; Trace

Indexed keywords

BUG; POST-SILICON DEBUG; SCAN; SUSPECT WINDOW; TRACE;

INTEGRATED CIRCUITS; WINDOWS;

LAW ENFORCEMENT;

EID: 70350398221     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2009.35     Document Type: Conference Paper

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