Silicon debug: scan chains alone are not enough

IEEE International Test Conference (TC)

Volumn , Issue , 1999, Pages 892-902

  van Rootselaar, Gert Jan ^a   Vermeulen, Bart ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED SOFTWARE ENGINEERING; DATABASE SYSTEMS; FLIP FLOP CIRCUITS; INTEGRATED CIRCUITS; MICROPROCESSOR CHIPS; SEMICONDUCTING SILICON; TRANSISTORS;

DESIGN FOR DEBUG; MULTIPLE CLOCK DOMAIN; SILICON DEBUG; SYSTEM ON A CHIP;

COMPUTER DEBUGGING;

EID: 0033345779     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)