The novel synchronous ion shield mass analyzer

Journal of Mass Spectrometry

Volumn 44, Issue 9, 2009, Pages 1330-1337

  Hauschild, J P ^a   Wapelhorst, E ^a   Muller J ^a  

^a HAMBURG UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Ion optics; Ion trajectory simulation; MEMS; Microfabrication; Micromass spectrometer; Synchronous ion shield

Indexed keywords

ENERGY FILTER; ION OPTICS; ION TRAJECTORY SIMULATION; MASS ANALYZERS; MICROELECTROMECHANICAL SYSTEMS; MICROMASS SPECTROMETER; SIMULATION RESULT; SYNCHRONOUS ION SHIELD;

COMPOSITE MICROMECHANICS; MASS SPECTROMETERS; MASS SPECTROMETRY; MEMS; MICROANALYSIS; MICROELECTROMECHANICAL DEVICES; MICROFABRICATION; MICROMACHINING; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SURVEYING INSTRUMENTS; SWITCHING CIRCUITS;

IONS;

ION;

ANALYZER; ARTICLE; ION TRAP MASS SPECTROMETRY; IONIZATION; MASS SPECTROMETER; MASS SPECTROMETRY; MICROELECTROMECHANICAL SYSTEM; OPTICS; PRIORITY JOURNAL; QUADRUPOLE MASS SPECTROMETRY; SIMULATION; SYNCHRONOUS ION SHIELD; TIME OF FLIGHT MASS SPECTROMETRY;

EID: 70350276238     PISSN: 10765174     EISSN: 10969888     Source Type: Journal    
DOI: 10.1002/jms.1615     Document Type: Article

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