Comparison of methods for estimating the conversion gain of CMOS active pixel sensors

IEEE Sensors Journal

Volumn 8, Issue 10, 2008, Pages 1734-1744

  Bohndiek, Sarah E ^a   Blue, Andrew ^b   Clark, Andy T ^c   Prydderch, Mark L ^c   Turchetta, Renato ^c   Royle, Gary J ^a   Speller, Robert D ^a  

^a UNIVERSITY COLLEGE LONDON   (United Kingdom)

^b UNIVERSITY OF GLASGOW   (United Kingdom)

^c RUTHERFORD APPLETON LABORATORY   (United Kingdom)

Author keywords

Image sensors; Semiconductor device; Shot noise

Indexed keywords

ABSOLUTE PERFORMANCE; ACTIVE PIXEL SENSOR; ALTERNATIVE METHODS; CMOS ACTIVE PIXEL SENSORS; CMOS APS; COMPARISON OF METHODS; COMPLIMENTARY METAL OXIDE SEMICONDUCTORS; CONVERSION GAIN; DATA SETS; FULL WELL CAPACITY; GOLD STANDARDS; INTENSITY LEVELS; LINEAR METHODS; MEAN VARIANCE; MEASUREMENT PROCEDURES; NON-LINEAR ESTIMATION; NON-LINEAR METHODS; NON-LINEARITY; NONLINEAR ANALYSIS METHODS; NONLINEAR COMPENSATION; READ NOISE; SCIENTIFIC APPLICATIONS; SINGLE SENSOR;

IMAGE SENSORS; PIXELS; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR SWITCHES; SHOT NOISE;

NONLINEAR ANALYSIS;

EID: 70350149450     PISSN: 1530437X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSEN.2008.2004296     Document Type: Article

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