An enhanced-performance CMOS imager with a flushed-reset photodiode pixel

IEEE Transactions on Electron Devices

Volumn 50, Issue 1, 2003, Pages 48-56

  Pain, Bedabrata ^a   Yang, Guang ^a   Cunningham, Thomas J ^a   Wrigley, Chris ^a   Hancock, Bruce ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

CMOS imager; Image lag; Image sensor; Linearity; Photodetector; Reset noise

Indexed keywords

CMOS INTEGRATED CIRCUITS; FIELD EFFECT TRANSISTORS; GATES (TRANSISTOR); IMAGE QUALITY; PHOTODETECTORS; PHOTODIODES; SPURIOUS SIGNAL NOISE; THRESHOLD VOLTAGE;

CMOS IMAGER; FLUSHED-RESET PHOTODIODE PIXEL; IMAGE LAG; LINEARITY;

IMAGE SENSORS;

EID: 0037247294     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2002.806969     Document Type: Article

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