Fundamental performance differences between CMOS and CCD imagers; Part I

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6276, Issue , 2006, Pages

  Janesick, Jim ^a   Andrews, James T ^b   Elliott, Tom ^c  

^a SARNOFF CORPORATION   (United States)

^b SARNOFF CORPORATION   (United States)

^c CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

CMOS and CCD imagers; Correlated double sampling; Flicker; Nonlinearity; Photon transfer; Sense node sensitivity; White and random telegraph noise

Indexed keywords

CMOS AND CCD IMAGERS; CORRELATED DOUBLE SAMPLING; FLICKER; NONLINEARITY; PHOTON TRANSFER; RANDOM TELEGRAPH NOISE; SENSE NODE SENSITIVITY;

ARRAYS; CHARGE COUPLED DEVICES; DATA ACQUISITION; ELECTRONS; IMAGE SENSORS;

CMOS INTEGRATED CIRCUITS;

EID: 33749600119     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.678867     Document Type: Conference Paper

References (5)

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