Efficient reliability simulation of analog ICs including variability and time-varying stress

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2009, Pages 1238-1241

  Maricau, Elie ^a   Gielen, Georges ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

RELIABILITY; TIMING CIRCUITS;

AGGRESSIVE SCALING; ANALOG AND DIGITAL CIRCUITS; CIRCUIT RELIABILITY; INNOVATIVE METHODOLOGIES; PROCESS VARIABILITY; RELIABILITY SIMULATION; TIME-VARYING STRESS; VARIABILITY-AWARE;

ANALOG INTEGRATED CIRCUITS;

EID: 70350068400     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/date.2009.5090853     Document Type: Conference Paper

References (10)

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10. E. Maricau et al, "Reliability Simulation of Analog ICs under Time-Varying Stress in Nanoscale CMOS," ITC DRVW, 2008.