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Volumn 9, Issue 9, 2009, Pages 3203-3208

Quantifying the semiconducting fraction in single-walled carbon nanotube samples through comparative atomic force and photoluminescence microscopies

Author keywords

[No Author keywords available]

Indexed keywords

AFM; AS-GROWN; ATOMIC FORCE; BULK CHARACTERIZATION; CONTROLLED GROWTH; DENSITY GRADIENTS; GROWTH METHOD; NEAR-IR; NUMBER DENSITY; PHOTOLUMINESCENCE MICROSCOPY; SAMPLE COMPOSITION; SEMI-CONDUCTING NANOTUBES; ULTRACENTRIFUGATION;

EID: 70349971677     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl9014342     Document Type: Article
Times cited : (62)

References (51)
  • 4
    • 61449177734 scopus 로고    scopus 로고
    • S. J. carbon nanotube electronics and optoelectronics
    • Rotkin, S V., Subramoney, S., Eds.; Springer: Berlin
    • Avouris, P.; Radosavljevic, M.; Wind, S. J. Carbon Nanotube Electronics and Optoelectronics. In Applied Physics of Carbon Nanotubes; Rotkin, S. V., Subramoney, S., Eds.; Springer: Berlin, 2005; pp 227 -251.
    • (2005) Applied Physics of Carbon Nanotubes , pp. 227-251
    • Avouris, P.1    Radosavljevic, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.