The Multidimensional Integrated Intelligent Imaging project (MI-3)

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 604, Issue 1-2, 2009, Pages 196-198

  Allinson, N ^a   Anaxagoras, T ^a   Aveyard, J ^c   Arvanitis, C ^b   Bates, R ^e   Blue, A ^e   Bohndiek, S ^b   Cabello, J ^f   Chen, L ^d   Chen, S ^j   Clark, A ^g   Clayton, C ^a   Cook, E ^b   Cossins, A ^c   Crooks, J ^g   El Gomati, M ^d   Evans, P M ^h   Faruqi, W ^j   French, M ^g   Gow, J ⁱ   Greenshaw, T ^c   Greig, T ⁱ   Guerrini, N ^g   Harris, E J ^h   Henderson, R ^j   Holland, A ⁱ   Jeyasundra, G ⁱ   Karadaglic, D ^c   Konstantinidis, A ^b   Liang, H X ^c   Maini, K M S ^b   McMullen, G ^j   Olivo, A ^b   O'Shea, V ^e   Osmond, J ⁱ   Ott, R J ^h   Prydderch, M ^g   Qiang, L ^a   Riley, G ^a   Royle, G ^b   Segneri, G ^b   Speller, R ^b   Symonds Tayler, J R N ^h   Triger, S ^a   Turchetta, R ^g   Venanzi, C ^b   Wells, K ^f   Zha, X ^d   Zin, H ^h   more..

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

^b UNIVERSITY COLLEGE LONDON   (United Kingdom)

^c UNIVERSITY OF LIVERPOOL   (United Kingdom)

^d UNIVERSITY OF YORK   (United Kingdom)

^e UNIVERSITY OF GLASGOW   (United Kingdom)

^f UNIVERSITY OF SURREY   (United Kingdom)

^g RUTHERFORD APPLETON LABORATORY   (United Kingdom)

^h INSTITUTE OF CANCER RESEARCH   (United Kingdom)

ⁱ BRUNEL UNIVERSITY   (United Kingdom)

^j MRC LABORATORY OF MOLECULAR BIOLOGY   (United Kingdom)

more..

Author keywords

Active pixel sensors; Complementary metal oxide semiconductor

Indexed keywords

ACTIVE PIXEL SENSOR; ACTIVE PIXEL SENSORS; COMPLEMENTARY METAL OXIDE SEMICONDUCTORS; COMPLEMENTARY METAL-OXIDE SEMICONDUCTOR; DIFFRACTION IMAGING; DNA SEQUENCING; DYNAMIC RANGE; FIXED PATTERN NOISE; GAMMA CAMERA SYSTEMS; INTELLIGENT IMAGING; LARGE AREA SENSORS; LOW NOISE; NOVEL TECHNIQUES; REGIONS OF INTEREST; X-RAY PHASE-CONTRAST IMAGING;

GAMMA RAYS; IMAGE SENSORS; LITHIUM ALLOYS; NUCLEIC ACIDS; RADIOGRAPHY; RESEARCH LABORATORIES; SEMICONDUCTOR INSULATOR BOUNDARIES;

PIXELS;

EID: 66049144404     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2009.01.112     Document Type: Article

References (14)

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