Three-dimensional stimulated emission depletion microscopy of nitrogen-vacancy centers in diamond using continuous-wave light

Nano Letters

Volumn 9, Issue 9, 2009, Pages 3323-3329

  Han, Kyu Young ^a,b   Willig, Katrin I ^a   Rittweger, Eva ^a   Jelezko, Fedor ^c   Eggeling, Christian ^a   Hel, Stefan W ^a  

^a MAX PLANCK INSTITUTE FOR BIOPHYSICAL CHEMISTRY   (Germany)

^b Seoul National University   (South Korea)

^c UNIVERSITY OF STUTTGART   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AT-WAVELENGTH; CONTINUOUS WAVES; DIAMOND CRYSTALS; FAR-FIELD; HIGH DENSITY; HIGH REPETITION; LIFE-SCIENCES; NANO-DIAMONDS; NANOOPTICS; NITROGEN-VACANCY CENTER; NV CENTER; PHOTOSTABLE; PULSED LASER; STIMULATED EMISSION DEPLETION; STIMULATED EMISSION DEPLETION MICROSCOPY; THREE DIMENSIONS;

COLOR; COLOR CENTERS; DIAMONDS; LIGHT; LUMINESCENCE; STIMULATED EMISSION; THREE DIMENSIONAL; VACANCIES;

CONTINUOUS WAVE LASERS;

NANOPARTICLE; NITROGEN;

ARTICLE; CHEMISTRY; FLUORESCENCE MICROSCOPY; LIGHT; LUMINESCENCE; MATERIALS TESTING; NANOTECHNOLOGY; PARTICLE SIZE; SURFACE PROPERTY;

LIGHT; LUMINESCENCE; MATERIALS TESTING; MICROSCOPY, FLUORESCENCE; NANOPARTICLES; NANOTECHNOLOGY; NITROGEN; PARTICLE SIZE; SURFACE PROPERTIES;

EID: 70349960060     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl901597v     Document Type: Article

References (43)

1. Abbe, E. Arch. Mikrosk. Anat. 1873, 9, 413-468.
2. Hell, S. W.; Wichmann, J. Opt. Lett. 1994, 19 (11), 780-782.
3. Klar, T. A.; Jakobs, S.; Dyba, M.; Egner, A.; Hell, S. W. Proc. Natl. Acad. Sci. U.S.A. 2000, 97, 8206-8210.
4. Willig, K. I.; Rizzoli, S. O.; Westphal, V.; Jahn, R.; Hell, S. W. Nature 2006, 440 (7086), 935-939.
5. Eggeling, C.; Ringemann, C.; Medda, R.; Schwarzmann, G.; Sandhoff, K.; Polyakova, S.; Belov, V. N.; Hein, B.; von Middendorff, C.; Schonle, A.; Hell, S. W. Nature 2009, 457, 1159-1163.
6. Chan, W. C. W.; Nie, S. M. Science 1998, 281, 2016-2018.
7. Michalet, X.; Pinaud, F. F.; Bentolila, L. A.; Tsay, J. M.; Doose, S.; Li, J. J.; Sundaresan, G.; Wu, A. M.; Gambhir, S. S.; Weiss, S. Science 2005, 307 (5709), 538-544.
8. Gruber, A.; Drabenstedt, A.; Tietz, C.; Fleury, L.; Wrachtrup, J.; von Borczyskowski, C. Science 1997, 276, 2012-2014.
9. Jelezko, F.; Wrachtrup, J. Phys. Status Solidi A 2006, 203, 3207-3225.
10. Rittweger, E.; Han, K. Y.; Irvine, S. E.; Eggeling, C.; Hell, S. W. Nat. Photonics 2009, 3, 144-147.
11. Hell, S. W.; Dyba, M.; Jakobs, S. Curr. Opin. Cell. Biol. 2004, 14 (5), 599-609.
12. Hell, S. W. Science 2007, 316 (5828), 1153-1158.
13. Hell, S. W. Nat. Biotechnol. 2003, 21 (11), 1347-1355.
14. Harke, B.; Keller, J.; Ullal, C. K.; Westphal, V.; Schoenle, A.; Hell, S. W. Opt. Express 2008, 16 (6), 4154-4162.
15. Willig, K. I.; Harke, B.; Medda, R.; Hell, S. W. Nat. Methods 2007, 4 (11), 915-918.
16. Drabenstedt, A.; Fleury, L.; Tietz, C.; Jelezko, F.; Kilin, S.; Nizovtzev, A.; Wrachtrup, J. Phys. Rev.B 1999, 60 (16), 11503-11508.
17. Kurtsiefer, C.; Mayer, S.; Zarda, P.; Weinfurter, H. Phys. Rev. Lett. 2000, 85 (2), 290-293.
18. Rogers, L. J.; Armstrong, S.; Sellars, M. J.; Manson, N. B. New J. Phys. 2008, 10, 103024.
19. Hell, S. W., Increasing the resolution of far-field fluorescence light microscopy by point-spread-function engineering. In Topics in Fluorescence Spectroscopy, Lakowicz, J. R., Ed.; Plenum Press: New York, 1997; Vol.5, pp 361-422.
20. Hofmann, M.; Eggeling, C.; Jakobs, S.; Hell, S. W. Proc. Natl. Acad. Sci. U.S.A. 2005, 102 (49), 17565-17569.
21. Ringemann, C.; Schonle, A.; Giske, A.; von Middendorff, C.; Hell, S. W.; Eggeling, C. ChemPhysChem 2008, 9 (9), 612-624.
22. Auksorius, E.; Boruah, B. R.; Dunsby, C.; Lanigan, P. M. P.; Kennedy, G.; Neil, M. A. A.; French, P. M. W. Opt. Lett. 2008, 33 (2), 113-115.
23. Beveratos, A.; Brouri, R.; Gacoin, T.; Villing, A.; Poizat, J. P.; Grangier, P. Phys. Rev. Lett. 2002, 89, 187901.
24. Hanbury Brown, R.; Twiss, R. Q. Nature 1956, 177 (4497), 27-29.
25. Hell, S. W.; Soukka, J.; Haenninen, P. E. Bioimaging 1995, 3, 65-69.
26. Weston, K. D.; Dyck, M.; Tinnefeld, P.; Muller, C.; Herten, D. P.; Sauer, M. Anal. Chem. 2002, 74 (20), 5342-5349.
27. Sykora, J.; Kaiser, K.; Gregor, I.; Bonigk, W.; Schmalzing, G.; Enderlein, J. Anal. Chem. 2007, 79 (11), 4040-4049.
28. Masuo, S.; Vosch, T.; Cotlet, M.; Tinnefeld, P.; Habuchi, S.; Bell, T. D. M.; Oesterling, I.; Beljonne, D.; Champagne, B.; Muellen, K.; Sauer, M.; Hofkens, J.; De Schryver, F. C. J. Phys. Chem. B 2004, 108 (43), 16686-16696.
29. Beveratos, A.; Brouri, R.; Gacoin, T.; Poizat, J. P.; Grangier, P. Phys. Rev. A: At., Mol., Opt. Phys. 2001, 64, 061802.
30. Kuehn, S.; Hettich, C.; Schmitt, C.; Poizat, J. P.; Sandoghdar, V. J. Microsc. (Oxford, U.K.) 2001, 202 (1), 2-6.
31. Neugart, F.; Zappe, A.; Jelezko, F.; Tietz, C.; Boudou, J. P.; Krueger, A.; Wrachtrup, J. Nano Lett. 2007, 7 (12), 3588-3591.
32. Fu, C. C.; Lee, H. Y.; Chen, K.; Lim, T. S.; Wu, H. Y.; Lin, P. K.; Wei, P. K.; Tsao, P. H.; Chang, H. C.; Fann, W. Proc. Natl. Acad. Sci. U.S.A. 2007, 104 (3), 727-732.
33. Krueger, A. Chem. Eur. J. 2008, 14, 1382-1390.
34. Vial, S.; Mansuy, C.; Sagan, S.; Irinopoulou, T.; Burlina, F.; Boudou, J. P.; Chassaing, G.; Lavielle, S. ChemBioChem 2008, 9, 2113-2119.
35. Smith, B. R.; Inglis, D. W.; Sandnes, B.; Rabeau, J. R.; Zvyagin, A. V.; Gruber, D.; Noble, C. J.; Vogel, R.; Osawa, E.; Plakhotnik, T. Small 2009, Doi: 10.1002/smll.200801802.
36. Kastrup, L.; Blom, H.; Eggeling, C.; Hell, S. W. Phys. Rev. Lett. 2005, 94, 178104.
37. Rittweger, E.; Wildanger, D.; Hell, S. W. EPL 2009, 86, 14001.
38. Hell, S. W. Nat. Methods 2009, 6 (1), 24-32.
39. Gaebel, T.; Domhan, M.; Wittmann, C.; Popa, I.; Jelezko, F.; Rabeau, J.; Greentree, A.; Prawer, S.; Trajkov, E.; Hemmer, P. R.; Wrachtrup, J. Appl. Phys. B: Lasers Opt. 2006, 82 (2), 243-246.
40. Taylor, J. M.; Cappellaro, P.; Childress, L.; Jiang, L.; Budker, D.; Hemmer, P. R.; Yacoby, A.; Walsworth, R.; Lukin, M. D. Nat. Phys. 2008, 4, 810-816.
41. Balasubramanian, G.; Chan, I. Y.; Kolesov, R.; Al-Hmoud, M.; Tisler, J.; Shin, C.; Kim, C.; Wojcik, A.; Hemmer, P. R.; Krueger, A.; Hanke, T.; Leitenstorfer, A.; Bratschitsch, R.; Jelezko, F.; Wrachtrup, J. Nature 2008, 455, 648-651.
42. Hell, S. W.; Kroug, M. Appl. Phys. B: Lasers Opt. 1995, 60, 495-497.
43. Bretschneider, S.; Eggeling, C.; Hell, S. W. Phys. Rev. Lett. 2007, 98, 218103.