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Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 27, Issue 5, 2009, Pages 2124-2127

Structural and electrical properties of metal contacts on n -type ZnO thin film deposited by vacuum coating technique

(2) Periasamy, C a Chakrabarti, P a

a BANARAS HINDU UNIVERSITY (India)

Author keywords

[No Author keywords available]

Indexed keywords

AL CONTACT; ATOMIC FORCE; ATOMIC FORCE MICROGRAPHS; BAND GAPS; BARRIER HEIGHTS; COATED GLASS SUBSTRATES; METAL CONTACTS; PYRAMIDAL SHAPE; SPECTROSCOPIC MEASUREMENTS; STRUCTURAL AND ELECTRICAL PROPERTIES; THERMAL EVAPORATION TECHNIQUE; VACUUM COATING; ZNO MICRO-PARTICLES; ZNO THIN FILM;

ABSORPTION SPECTROSCOPY; ATOMIC FORCE MICROSCOPY; CURRENT VOLTAGE CHARACTERISTICS; DISTILLATION; ELECTRIC PROPERTIES; METALLIC FILMS; OPTICAL FILMS; PHOTORESISTS; PLATINUM; SCANNING TUNNELING MICROSCOPY; SURFACE PROPERTIES; SURFACE ROUGHNESS; THERMAL EVAPORATION; THIN FILM DEVICES; THIN FILMS; ZINC OXIDE;

SEMICONDUCTING ZINC COMPOUNDS;

EID: 70349690432 PISSN: 10711023 EISSN: None Source Type: Journal
DOI: 10.1116/1.3196786 Document Type: Article

Times cited : (29)

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