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Volumn 82, Issue 11, 2008, Pages 1274-1279
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Optical and electrical properties of ZnO films deposited by activated reactive evaporation
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Author keywords
Refractive index; Sheet resistance; Structural properties; ZnO films
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Indexed keywords
DEPOSITION;
ELECTRIC CONDUCTIVITY;
EVAPORATION;
OPTICAL CONSTANTS;
REFRACTIVE INDEX;
SHEET RESISTANCE;
SILICON;
STRUCTURAL PROPERTIES;
ZINC OXIDE;
ACTIVATED REACTIVE EVAPORATION;
OXYGEN PARTIAL PRESSURE;
OXIDE FILMS;
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EID: 46549089004
PISSN: 0042207X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.vacuum.2008.03.043 Document Type: Article |
Times cited : (27)
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References (21)
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