-
1
-
-
51349158472
-
-
ECTC
-
B. Roggeman, P.Borgesen, J. Li, G. Godbole, P. Tumne, K. Srihari, T. Levo, J. Pitarresi, "Assessment of PCB Pad Cratering resistance by Joint Level Testing", ECTC 2008. pp. 884-892.
-
(2008)
Assessment of PCB Pad Cratering resistance by Joint Level Testing
, pp. 884-892
-
-
Roggeman, B.1
Borgesen, P.2
Li, J.3
Godbole, G.4
Tumne, P.5
Srihari, K.6
Levo, T.7
Pitarresi, J.8
-
3
-
-
35348832874
-
-
ECTC
-
F. Song, S.W. Ricky Lee, K. Newman, B. Sykes, S.Clark, "Brittle Failure Mechanism of SnAgCu and SnPb Solder Balls during High Speed Ball Shear and Cold Ball Pull Tests", ECTC 2007, pp. 364-372
-
(2007)
Brittle Failure Mechanism of SnAgCu and SnPb Solder Balls during High Speed Ball Shear and Cold Ball Pull Test
, pp. 364-372
-
-
Song, F.1
Ricky Lee, S.W.2
Newman, K.3
Sykes, B.4
Clark, S.5
-
5
-
-
33845571954
-
-
ECTC
-
E.H. Wong, Y-W Mai, R. Rajoo, K.T. Tsai, F. Liu, S.K.W. Seah, C-L Yeh, "Micro Impact Characterisation of Solder joint for Drop Impact Application", 2006 ECTC, pp 64-71.
-
(2006)
Micro Impact Characterisation of Solder Joint for Drop Impact Application
, pp. 64-71
-
-
Wong, E.H.1
Mai, Y.-W.2
Rajoo, R.3
Tsai, K.T.4
Liu, F.5
Seah, S.K.W.6
Yeh, C.-L.7
-
6
-
-
33847253025
-
-
EPTC
-
C-L Yeh, Y-S Lai, H-C Chang, T-H Chen, "Correlation Between Package-level Ball Impact test and Board level Drop test", EPTC 2005.pp270-275.
-
(2005)
Correlation between Package-level Ball Impact Test and Board Level Drop Test
, pp. 270-275
-
-
Yeh, C.-L.1
Lai, Y.-S.2
Chang, H.-C.3
Chen, T.-H.4
-
7
-
-
3142756580
-
Ductile-to-Brittle transition in Sn-Zn solder joints measured by impact test
-
M. Date, T. Shoji, M. Fujiyoshi, K. Sato, K.N. Tu, "Ductile-to- Brittle transition in Sn-Zn solder joints measured by impact test", Scripta Materialia.2004.pp 641-645.
-
(2004)
Scripta Materialia
, pp. 641-645
-
-
Date, M.1
Shoji, T.2
Fujiyoshi, M.3
Sato, K.4
Tu, K.N.5
-
9
-
-
0038737535
-
The Rigid Pendulum - An Antique but Evergreen Physical Model
-
E.I. Butikov, "The Rigid Pendulum - an Antique but Evergreen Physical Model", European Journal of Physics, Vol. 20, No. 5, 1999, pp. 429-441.
-
(1999)
European Journal of Physics
, vol.20
, Issue.5
, pp. 429-441
-
-
Butikov, E.I.1
-
10
-
-
70349654374
-
-
JEDEC Standard JESD22-B117A
-
JEDEC Standard JESD22-B117A, Solder Ball Shear, 2006.
-
(2006)
Solder Ball Shear
-
-
-
11
-
-
48149090559
-
Pb-free Solder: SAC105 vs. SAC305 Drop- Test Reliability Data Comparison
-
G. Iyer, E. Ouyang, W. Kittidacha, S. Tantideeravit, Suresh. LK, "Pb-free Solder: SAC105 vs. SAC305 Drop- Test Reliability Data Comparison", Electronic Manufacturing Technology Symposium, pp 251 - 255.
-
Electronic Manufacturing Technology Symposium
, pp. 251-255
-
-
Iyer, G.1
Ouyang, E.2
Kittidacha, W.3
Tantideeravit, S.4
Lk, Suresh.5
-
12
-
-
51349121097
-
Effect of Ag content on the microstructure of Sn-Ag-Cu based solder alloys
-
M. Reid, J. Punch, M. Collins, C. Ryan, "Effect of Ag content on the microstructure of Sn-Ag-Cu based solder alloys", Soldering & Surface Mount Technology, 2008, pp 3-8.
-
(2008)
Soldering & Surface Mount Technology
, pp. 3-8
-
-
Reid, M.1
Punch, J.2
Collins, M.3
Ryan, C.4
-
13
-
-
33845710415
-
Finding solutions to the challenges in package interconnect reliability
-
November 9
-
L. Garner, S. Sane, D. Suh, T. Byrne, A. Dani, T. Martin, M. Mello, M. Patel, R. Williams, Finding Solutions to the Challenges in Package Interconnect Reliability, Intel Technology Journal, issue 4, November 9 2005, pp 297- 308.
-
(2005)
Intel Technology Journal
, Issue.4
, pp. 297-308
-
-
Garner, L.1
Sane, S.2
Suh, D.3
Byrne, T.4
Dani, A.5
Martin, T.6
Mello, M.7
Patel, M.8
Williams, R.9
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