Interface structure of an epitaxial iron silicide on Si(111) studied with X-Ray diffraction

e-Journal of Surface Science and Nanotechnology

Volumn 7, Issue , 2009, Pages 513-517

  Shirasawa, Tetsuroh ^a   Sekiguchi, Kouji ^a   Iwasawa, Yusaku ^a   Voegeli, Wolfgang ^a   Takahashi, Toshio ^a   Hattori, Ken ^b,c   Hattori, Azusa N ^b,c   Daimon, Hiroshi ^b,c   Wakabayashi, Yusuke ^d  

^a UNIVERSITY OF TOKYO   (Japan)

^b NARA INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

^c JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^d INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

Author keywords

Diffraction; Iron; Reflection; Silicides; Single crystal epitaxy; X ray scattering

Indexed keywords

ATOMS; BOND LENGTH; CESIUM COMPOUNDS; DIFFRACTION; EPITAXIAL GROWTH; INTERFACES (MATERIALS); IRON; IRON COMPOUNDS; REFLECTION; SILICIDES; SINGLE CRYSTALS; ULTRATHIN FILMS; X RAY DIFFRACTION; X RAY SCATTERING;

FILM ROUGHNESS; FIT PARAMETERS; INTERFACE STRUCTURES; INTERLAYER SPACINGS; SCATTERING MEASUREMENTS; SILICIDE FILMS; SINGLE CRYSTAL EPITAXY; STACKING ORIENTATION;

CRYSTAL ATOMIC STRUCTURE;

EID: 70349615113     PISSN: None     EISSN: 13480391     Source Type: Journal    
DOI: 10.1380/ejssnt.2009.513     Document Type: Conference Paper

References (22)

1. J. Derrien, J. Chevrier, V., Le Thanh, T. E. Crumbaker, J. Y. Natoli, and I. Berbezier, Appl. Surf. Sci. 70-71, 546 (1993).
2. D. Leong, M. Harry, K. J. Reeson, and K. P. Homewood, Nature 387, 686 (1997).
3. K. Lange, Phys. Stat. Sol. (b) 201, 3 (1997).
4. A. Kawaharazuka, M. Ramsteiner, J. Herfort, H.-P. Schönherr, H. Kostial, and K. H. Ploog, Appl. Phys. Lett. 85, 3492 (2004).
5. H. von Känel, R. Stalder, H. Sirringhaus, N. Onda, and J. Henz, Appl. Surf. Sci. 53, 196 (1991).
6. H., von Känel, K. A. Mäder, E. Müller, N. Onda, and H. Sirringhaus, Phys. Rev. B 45, 13807 (1992).
7. S. Hajjar, G. Garreau, S. Pelletier, D. Bolmont, and C. Pirri, Phys. Rev. B 68, 033302 (2003).
8. M. Krause, F. Blobner, L. Hammer, K. Heinz, and U. Starke, Phys. Rev. B 68, 125306 (2003).
9. S.Walter, F. Blobner, M. Krause, S. Müler, K. Heinz, and U. Starke, J. Phys.: Condens. Matter 15, 5207 (2003).
10. M. Matsumoto, K. Sugie, T. Kawauchi, K. Fukutani, and T. Okano, Jpn. J. Appl. Phys. 45, 2390 (2006).
11. K. Kataoka, K. Hattori, Y. Miyatake, and H. Daimon, Phys. Rev. B 74, 155406 (2006).
12. K. Hattori, K. Kataoka, A. N. Hattori, and H. Daimon, Hyoumen Kagaku 29, 120 (2008).
13. T. Takahashi, S. Nakatani, T. Ishikawa, and S. Kikuta, Surf. Sci. 191, L825 (1987).
14. I. K. Robinson and R. T. Tung, Phys. Rev. B 38, 3632 (1988).
15. R. Feidenhans'l, Surf. Sci. Rep. 10, 105 (1989).
16. I. K. Robinson and D. J. Tweet, Rep. Prog. Phys. 55, 599 (1992).
17. T. Takahashi and S. Nakatani, Surf. Sci. 282, 17 (1993).
18. K. Hattori, T. Nishimura, K. Kataoka, Y. Shimamoto, and H. Daimon, Thin Solid Films 464-465, 5 (2004).
19. E. G. Moroni, W. Wolf, J. Hafner, and R. Podloucky, Phys. Rev. B 59, 12860 (1999).
20. G. Profeta, S. Picozzi, A. Continenza, and R. Podloucky, Phys. Rev. B 70, 235338 (2004).
21. L. B. Steren, J. Milano, V. Garcia, M. Marangolo, M. Eddrief, and V. H. Etgens, Phys. Rev. B 74, 144402 (2007).
22. M. Csontos, G. Mihály, B. Jankó, T. Wojtowicz, X. Liu, and J. K. Furdyna, Nature Mat. 4, 447 (2005).