Vacancies ordered in screw form (VOSF) and layered indium selenide thin film deposition by laser back ablation

Applied Surface Science

Volumn 255, Issue 24, 2009, Pages 9707-9711

  Beck, Kenneth M ^a   Wiley, William R ^a   Venkatasubramanian, Eswaranand ^b   Ohuchi, Fumio ^b  

^a PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF WASHINGTON   (United States)

Author keywords

Chalcogenides; Indium selenide; LIFT; Phase change; Pulse laser ablation; VOSF

Indexed keywords

ABLATION; CHALCOGENIDES; DEPOSITION; INDIUM COMPOUNDS; INORGANIC COMPOUNDS; LASER ABLATION; LIFT; RANDOM ACCESS STORAGE; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

CHARACTERIZATION OF THE FILMS; INDIUM SELENIDE; PHASE CHANGE; POST DEPOSITION ANNEALING; PULSE LASER ABLATION; SUBSTRATE TEMPERATURE; THIN-FILM DEPOSITIONS; VOSF;

THIN FILMS;

EID: 70349459522     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2009.04.054     Document Type: Article

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