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Volumn 38, Issue 2 A, 1999, Pages 668-673

Molecular beam epitaxy and characterization of layered in2Se3 films grown on slightly misoriented (001)GaAs substrates

Author keywords

Anisotropic properties; III VI compound semiconductors; In2Se3; Layered structure; Molecular beam epitaxy

Indexed keywords


EID: 0003347191     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.38.668     Document Type: Article
Times cited : (17)

References (15)
  • 7
    • 33644680838 scopus 로고
    • Ph.D. Thesis at Tokyo Institute of Technology, Tokyo, Japan
    • J. Ye: Ph.D. Thesis at Tokyo Institute of Technology, Tokyo, Japan, 1995.
    • (1995)
    • Ye, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.