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Volumn 38, Issue 2 A, 1999, Pages 668-673
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Molecular beam epitaxy and characterization of layered in2Se3 films grown on slightly misoriented (001)GaAs substrates
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Author keywords
Anisotropic properties; III VI compound semiconductors; In2Se3; Layered structure; Molecular beam epitaxy
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Indexed keywords
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EID: 0003347191
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.38.668 Document Type: Article |
Times cited : (17)
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References (15)
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