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Volumn 262, Issue 1, 2000, Pages 200-206

Nanoscale roughness of oxide glass surfaces

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; FRACTURE; GLASS TRANSITION; MELTING; NANOSTRUCTURED MATERIALS; SILICA; SURFACE ROUGHNESS; SURFACE TENSION;

EID: 0033875431     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(99)00662-6     Document Type: Article
Times cited : (63)

References (28)
  • 21
    • 33847549946 scopus 로고
    • R.W. Douglas, B. Ellis (Eds.), Wiley, New York
    • T.P. Seward, D.R. Uhlmann, in: R.W. Douglas, B. Ellis (Eds.), Amorphous Materials, Wiley, New York, 1972, p. 327.
    • (1972) Amorphous Materials , pp. 327
    • Seward, T.P.1    Uhlmann, D.R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.