Multi-frequency response from a designed array of micromechanical cantilevers fabricated using a focused ion beam

Nanotechnology

Volumn 17, Issue 20, 2006, Pages 5233-5237

  Ghatnekar Nilsson, S ^a   Graham, J ^b   Hull, R ^b   Montelius, L ^a  

^a LUND UNIVERSITY   (Sweden)

^b University of Virginia   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ION BEAM MILLING; LABEL-FREE DETECTION; MICROMECHANICAL CANTILEVERS; MULTI-FREQUENCY SIGNAL ANALYSIS;

ARRAYS; CORRELATION THEORY; ION BEAMS; MEASUREMENT THEORY; NATURAL FREQUENCIES; OSCILLATORS (ELECTRONIC);

CANTILEVER BEAMS;

EID: 33749523895     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/17/20/031     Document Type: Article

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