Electrical bistabilities and memory stabilities of nonvolatile bistable devices fabricated utilizing C60 molecules embedded in a polymethyl methacrylate layer

Nanotechnology

Volumn 20, Issue 34, 2009, Pages

  Cho, Sung Hwan ^a   Lee, Dong Ik ^a   Jung, Jae Hun ^a   Kim, Tae Whan ^a  

^a Hanyang University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

BI-STABILITY; BISTABLE DEVICES; CURRENT-VOLTAGE MEASUREMENTS; CYCLING ENDURANCE; ELECTRICAL BISTABILITY; FITTING RESULTS; MEMORY DEVICE; NON-VOLATILE; OFF CURRENT; ON/OFF RATIO; RETENTION TIME; ROOM TEMPERATURE;

MOLECULES;

ALUMINUM; FULLERENE; POLY(METHYL METHACRYLATE);

ARTICLE; ELECTRIC CONDUCTIVITY; ELECTRIC POTENTIAL; ENERGY TRANSFER; MICROSCOPY; NANODEVICE; PRIORITY JOURNAL; ROOM TEMPERATURE;

EID: 70249126158     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/34/345204     Document Type: Article

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