Performance of silicon pore optics

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7011, Issue , 2008, Pages

  Collon, Maximilien J ^a   Günther, Ramses ^a   Ackermann, Marcelo ^a   Buis, E J ^b   Vacanti, G ^b   Beijersbergen, Marco W ^a   Bavdaz, Marcos ^c   Wallace, Kotska ^c   Freyberg, Michael ^d   Krumrey, Michael ^e  

^a Cosine Research BV ^*  (Netherlands)

^b Cosine Science and Computing BV ^*  (Netherlands)

^c EUROPEAN SPACE AGENCY   (Netherlands)

^d MAX PLANCK INSTITUT FÜR EXTRATERRESTRISCHE PHYSIK   (Germany)

^e PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

Pore optics; Silicon; Stack; Wafer; X ray astronomy; X ray optics; X ray telescopes

Indexed keywords

PORE OPTICS; STACK; WAFER; X-RAY ASTRONOMY; X-RAY TELESCOPES;

ASTRONOMICAL SATELLITES; ASTROPHYSICS; ELECTROMAGNETIC WAVES; GAMMA RAYS; INSTRUMENTS; LIGHT; MIRRORS; OPTICAL TELESCOPES; SEMICONDUCTING SILICON COMPOUNDS; SPACE TELESCOPES; SPACECRAFT EQUIPMENT; SPACECRAFT OBSERVATORIES; TECHNOLOGICAL FORECASTING; TECHNOLOGY; TEST FACILITIES; WAFER BONDING; X RAY CAMERAS; X RAY OPTICS; X RAYS;

SILICON WAFERS;

EID: 70249100684     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.789723     Document Type: Conference Paper

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