Imaging highly confined modes in sub-micron scale silicon waveguides using transmission-based near-field scanning optical microscopy

Optics Express

Volumn 14, Issue 22, 2006, Pages 10588-10595

  Robinson, Jacob T ^a   Preble, Stefan F ^a   Lipson, Michal ^a  

^a School of Operations Research and Industrial Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT POLARIZATION; OPTICAL RESOLVING POWER; PERTURBATION TECHNIQUES; PHOTONS; PROBES; SILICON; SILICON ON INSULATOR TECHNOLOGY;

OPTICAL DECAY; SCANNING OPTICAL MICROSCOPY; SILICON WAVEGUIDES;

OPTICAL WAVEGUIDES;

EID: 33750738880     PISSN: 10944087     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.14.010588     Document Type: Article

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