Altitude and underground real-time ser characterization of CMOS 65 nm SRAM

IEEE Transactions on Nuclear Science

Volumn 56, Issue 4, 2009, Pages 2258-2266

  Autran, J L ^a   Roche, P ^b   Sauze, S ^c   Gasiot, G ^b   Munteanu, D ^a   Loaiza, P ^d   Zampaolo, M ^d   Borel, J ^e  

^a AIX MARSEILLE UNIVERSITY   (France)

^b STMICROELECTRONICS   (France)

^c CNRS   (France)

^d CEA CNRS   (France)

^e LSM CEA CNRS ^*  (France)

Author keywords

Accelerated tests; Alpha contamination; Atmosp eric neutrons; Neutron induced SER; Real time testing; SER simulation; Single Event Rate (SER); Static memory; Terrestrial radiation environment

Indexed keywords

ACCELERATED TESTS; ALPHA CONTAMINATION; ATMOSP ERIC NEUTRONS; NEUTRON-INDUCED SER; REAL-TIME TESTING; SER SIMULATION; SINGLE-EVENT RATE (SER); STATIC MEMORY; TERRESTRIAL RADIATION ENVIRONMENT;

INFRARED RADIATION; NEUTRONS; RADIOACTIVITY MEASUREMENT; STATIC RANDOM ACCESS STORAGE;

NEUTRON IRRADIATION;

EID: 69549123005     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2009.2012426     Document Type: Conference Paper

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