Altitude SEE Test European Platform (ASTEP) and first results in CMOS 130 nm SRAM

IEEE Transactions on Nuclear Science

Volumn 54, Issue 4, 2007, Pages 1002-1009

  Autran, Jean Luc ^a,b,c   Roche, Philippe ^d   Borel, Joseph ^a,e   Sudre, Christophe ^b,e   Castellani Coulié, Karine ^b   Munteanu, Daniela ^a,b   Parrassin, Thierry ^d   Gasiot, Gilles ^d   Schoellkopf, Jean Pierre ^d  

^a IEEE

^b AIX MARSEILLE UNIVERSITÉ   (France)

^c INSTITUT UNIVERSITAIRE DE FRANCE   (France)

^d STMICROELECTRONICS   (France)

^e JB R and D ^*  (France)

Author keywords

Accelerated tests; Alpha SER; Atmospheric neutrons; Neutron SER; Real time testing; SER simulation; Single event effects (SEE); Single event rate (SER); Static memory; Terrestrial radiation environment

Indexed keywords

DATA STORAGE EQUIPMENT; INTERNET; NEUTRONS; REAL TIME SYSTEMS; REMOTE CONTROL; STATIC RANDOM ACCESS STORAGE;

ASTEP; SINGLE-EVENT RATE (SER); SOFT-ERROR RATE (SER); STATIC MEMORY;

CMOS INTEGRATED CIRCUITS;

EID: 34548063404     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2007.891398     Document Type: Conference Paper

References (13)

1. J. F. Ziegler and H. Puchner, SER-History, Trends and Challenges, Cypress Semiconductor. San Jose, CA, 2004.
2. E. Normand, "Single event upset at ground level," IEEE Trans. Nucl. Sci., vol. 43, no. 6, pp. 2742-2750, Dec. 1996.
3. T. J. O'Gorman, J. M. Ross, A. H. Taber, J. F. Ziegler, H. P. Muhlfeld, I. C. J. Montrose, H. W. Curtis, and J. L. Walsh, "Field testing for cosmic ray soft errors in semiconductor memories," IBM J. Res. Develop., vol. 40, no. 1, pp. 41-50, 1996.
4. P. E. Dodd, "Device simulation of charge collection and single-event upset," IEEE Trans. Nucl. Sci., vol. 43, no. 2, pp. 561-574, Apr. 1996.
5. R. C. Baumann, "Radiation-induced soft errors in advanced semiconductor technologies," IEEE Trans. Device Mater. Rel., vol. 5, no. 3, pp. 305-316, 2005.
6. P. Roche, "Year-in-review on radiation-induced soft error rate," in Pmc. IEEE Int. Reliability Physics Symp. Tutorial, San Jose, CA, Mar. 2006.
7. JEDEC Standard Measurement and Reporting of Alpha Particles and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices, JESD89 Arlington, VA: JEDEC Solid State Technology Association [Online], Available: http://www.jedec.org/download/search/JESD89A.pdf
8. P. Roche and G. Gasiot, "Impacts of front-end and middle-end process modifications on terrestrial soft error rate," IEEE Trans. Device Mater. Rel., vol. 5, no. 3, pp. 382-396, 2005.
9. P. Roche, "Comparisons of soft error rate for SRAMs in commercial SOI and bulk below the 130 nm technology node," IEEE Trans. Nucl. Sci., vol. 50, no. 6, pp. 2046-2054, Dec. 2003.
10. A. Lesea, S. Drimer, J. J. Fabula, C. Carmichael, and P. Alike, "The Rosetta experiment: Atmospheric soft error rate testing in differing technology FPGAs," IEEE Trans. Device Mater. Rel., vol. 5, no. 3, pp. 317-328, 2005.
11. H. Kobayashi, H. Usuki, K. Shiraishi, H. Tsuchiya, N. Kawamoto, G. Merchant, and J. Kase, "Comparison between neutron-induced system-SER and accelerated-SER in SRAMs," in Proc. IEEE Int. Reliability Physics Symp., Phoenix, AZ, 2004, pp. 288-293.
12. E. Normand and T. J. Baker, "Altitude and latitude variations in avionics SEU and atmospheric neutron flux," IEEE Trans. Nucl. Sci., vol. 40, no. 6, pp. 1484-1490, Dec. 1993.
13. E. Normand, "Correlation, of inflight neutron, dosimeter and SEU measurements with atmospheric neutron model," IEEE Trans. Nucl. Sci., vol. 48, no. 6, pp. 1996-2003, Dec. 2001.