Real-time neutron and alpha soft-error rate testing of CMOS 130nm SRAM: Altitude versus underground measurements

Proceedings - 2008 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT

Volumn , Issue , 2008, Pages 233-236

  Autran, J L ^a,b   Roche, P ^c   Sauze, S ^d   Gasiot, G ^c   Munteanu, D ^a,b   Loaiza, P ^e   Zampaolo, M ^e   Borel, J ^a,f  

^a IEEE

^b CNRS   (France)

^c STMICROELECTRONICS   (France)

^d AIX MARSEILLE UNIVERSITÉ   (France)

^e CEA CNRS   (France)

^f Laboratoire Souterrain de Modane ^*  (France)

Author keywords

Accelerated tests; Alpha contamination; Atmospheric neutrons; Neutron induced SER; Real time testing; SER simulation; Single Event Rate (SER); Static memory; Terrestrial radiation environment

Indexed keywords

ACCELERATED TESTS; ALPHA CONTAMINATION; ATMOSPHERIC NEUTRONS; EUROPEAN; EUROPEAN PLATFORM; EXPERIMENTAL DATA; INTEGRATED CIRCUIT DESIGN; INTERNATIONAL CONFERENCES; NEUTRON-INDUCED SER; ON CHIPS; RADIOACTIVE IMPURITIES; REAL-TIME MEASUREMENTS; REAL-TIME TESTING; SER SIMULATION; SINGLE-EVENT RATE (SER); SOFT ERROR RATES; SOFT-ERROR RATE; STATIC MEMORY; TERRESTRIAL RADIATION ENVIRONMENT; UNDERGROUND LABORATORY; WATER EQUIVALENT;

COSMOLOGY; ELECTRONICS INDUSTRY; ERROR ANALYSIS; INTEGRATED CIRCUIT MANUFACTURE; IONIZING RADIATION; LEARNING SYSTEMS; NEUTRONS; STATIC RANDOM ACCESS STORAGE; TECHNOLOGY; TIME MEASUREMENT;

INTEGRATED CIRCUITS;

EID: 51849136000     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICICDT.2008.4567284     Document Type: Conference Paper

References (11)

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2. J.F. Ziegler, H. Puchner, SER - History, Trends and Challenges, Cypress Semiconductor, 2004. See also references therein.
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