메뉴 건너뛰기




Volumn 7318, Issue , 2009, Pages

Integration of a carbon nanotube field emission electron gun for a miniaturized time-of-flight mass spectrometer

Author keywords

Carbon nanotube; Field emission; Time of flight mass spectrometry

Indexed keywords

A-CARBON; CLOSE PROXIMITY; CURRENT TRANSMISSION; ELECTRON IMPACT-IONIZATION; EMITTER TIPS; EXTRACTION VOLTAGE; FIELD-EMISSION ELECTRONS; FUNDAMENTAL CURRENT; IN-SITU; INTEGRATION TECHNIQUES; IONIZATION BEAMS; IONIZATION ENERGIES; PATTERNED ARRAYS; PLANETARY SCIENCE; THERMAL CHEMICAL VAPOR DEPOSITION; TIME-OF-FLIGHT MASS SPECTROMETERS; TIME-OF-FLIGHT MASS SPECTROMETRY;

EID: 69549113114     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.818939     Document Type: Conference Paper
Times cited : (6)

References (28)
  • 2
    • 46749107234 scopus 로고    scopus 로고
    • Exploration of the habitability of mars: Development of analytical protocols for measurement of organic carbon on the 2009 mars science laboratory
    • Mahaffy, P.R., "Exploration of the Habitability of Mars: Development of Analytical Protocols for Measurement of Organic Carbon on the 2009 Mars Science Laboratory, " Space Science Reviews 135, 255 (2008).
    • (2008) Space Science Reviews , vol.135 , pp. 255
    • Mahaffy, P.R.1
  • 6
    • 0028501945 scopus 로고
    • A curved field reflectron time-of-flight mass spectrometer for the simultaneous focusing of metastable product ions
    • Cornish, T. J., Cotter, R. J., "A Curved Field Reflectron Time-of-Flight Mass Spectrometer for the Simultaneous Focusing of Metastable Product Ions, " Rapid Communications in Mass Spectrometry 8, 781 (1994).
    • (1994) Rapid Communications in Mass Spectrometry , vol.8 , pp. 781
    • Cornish, T.J.1    Cotter, R.J.2
  • 8
    • 9744279393 scopus 로고
    • A carbon nanotube field-emission electron source
    • de Heer, W. A., Chatelain, A., Ugarte, D., "A carbon nanotube field-emission electron source, " Science 270, 1179 (1995).
    • (1995) Science , vol.270 , pp. 1179
    • De Heer, W.A.1    Chatelain, A.2    Ugarte, D.3
  • 9
    • 0347523033 scopus 로고
    • A simple and robust electron beam source from carbon nanotubes
    • Collins, P. G. and Zettl, A., "A simple and robust electron beam source from carbon nanotubes, " Appl. Phys. Lett. 69, 1969 (1996).
    • (1969) Appl. Phys. Lett. , vol.69 , pp. 1996
    • Collins, P.G.1    Zettl, A.2
  • 12
    • 33645507215 scopus 로고    scopus 로고
    • 2 current density from microgated carbon nanotube field-emitter arrays grown by dc plasma chemical-vapor deposition
    • 2 current density from microgated carbon nanotube field-emitter arrays grown by dc plasma chemical-vapor deposition, " Journal of Vacuum Science and Technology B 24, 988 (2006).
    • (2006) Journal of Vacuum Science and Technology B , vol.24 , pp. 988
    • Hsu, D.S.Y.1    Shaw, J.L.2
  • 13
    • 44349115494 scopus 로고    scopus 로고
    • Effect of nitrogen gas on the lifetime of carbon nanotube field emitters for electron-impact ionization mass spectrometry
    • Getty, S. A., Bis, R. A., Snyder, S., Gehrels, E., Ramirez, K., King, T. T., Roman, P. A., Mahaffy, P. R., "Effect of nitrogen gas on the lifetime of carbon nanotube field emitters for electron-impact ionization mass spectrometry, " Proceedings of the SPIE 6959, 695907 (2008).
    • (2008) Proceedings of the SPIE , vol.6959 , pp. 695907
    • Getty, S.A.1    Bis, R.A.2    Snyder, S.3    Gehrels, E.4    Ramirez, K.5    King, T.T.6    Roman, P.A.7    Mahaffy, P.R.8
  • 14
    • 0012363374 scopus 로고
    • Noise in field emission diodes
    • Timm, G. W. and van der Ziel, A., "Noise in Field Emission Diodes, " Physica 32, 1333 (1966).
    • (1966) Physica , vol.32 , pp. 1333
    • Timm, G.W.1    Van Der Ziel, A.2
  • 15
    • 0000707582 scopus 로고    scopus 로고
    • The environmental stability of field emission from single-walled carbon nanotubes
    • Dean, K. A. and Chalamala, B. R., "The environmental stability of field emission from single-walled carbon nanotubes, " Appl. Phys. Lett. 75, 3017 (1999).
    • (1999) Appl. Phys. Lett. , vol.75 , pp. 3017
    • Dean, K.A.1    Chalamala, B.R.2
  • 16
    • 0035903351 scopus 로고
    • Effects of O2, Ar, and H2 gases on the field-emission properties of single-walled and multiwalled carbon nanotubes
    • Wadhawan, A., Stallcup II, R. E., Stephens II, K. F., Perez, J. M., and Akwani, I. A., "Effects of O2, Ar, and H2 gases on the field-emission properties of single-walled and multiwalled carbon nanotubes, " Appl. Phys. Lett. 79, 1867 (2001).
    • (1867) Appl. Phys. Lett. , vol.79 , pp. 2001
    • Wadhawan, A.1    Stallcup II, R.E.2    Stephens II, K.F.3    Perez, J.M.4    Akwani, I.A.5
  • 17
    • 0042842365 scopus 로고    scopus 로고
    • Influences of the surface reactions on the field emission from multiwall carbon nanotubes
    • Dong, C. and Gupta, M. C., "Influences of the surface reactions on the field emission from multiwall carbon nanotubes, " Appl. Phys. Lett. 83, 159 (2003).
    • (2003) Appl. Phys. Lett. , vol.83 , pp. 159
    • Dong, C.1    Gupta, M.C.2
  • 18
    • 3042662054 scopus 로고    scopus 로고
    • Field emission current fluctuations from isolated carbon nanotubes
    • Tuggle, D. W., Jiao, J., and Dong, L. F., "Field emission current fluctuations from isolated carbon nanotubes, " Surface and Interface Analysis 36, 489 (2004).
    • (2004) Surface and Interface Analysis , vol.36 , pp. 489
    • Tuggle, D.W.1    Jiao, J.2    Dong, L.F.3
  • 19
    • 34047167001 scopus 로고    scopus 로고
    • Behaviors of single nitrogen molecule on pentagon at carbon nanotube tip observed by field emission microscopy
    • Waki, S., Hata, K., Sato, H, and Saito, Y., "Behaviors of single nitrogen molecule on pentagon at carbon nanotube tip observed by field emission microscopy, " J. Vac. Sci. Technol. B 25, 517 (2007).
    • (2007) J. Vac. Sci. Technol. B , vol.25 , pp. 517
    • Waki, S.1    Hata, K.2    Sato H3    Saito, Y.4
  • 21
    • 0037542493 scopus 로고    scopus 로고
    • Degradation and failure of carbon nanotube field emitters
    • Bonard, J.-M., Klinke, C., Dean, K. A., and Coll, B. F., "Degradation and failure of carbon nanotube field emitters, " Phys. Rev. B 67, 115406 (2003).
    • (2003) Phys. Rev. B , vol.67 , pp. 115406
    • Bonard, J.-M.1    Klinke, C.2    Dean, K.A.3    Coll, B.F.4
  • 22
    • 0000516567 scopus 로고    scopus 로고
    • Unique characteristics of cold cathode carbon-nanotube-matrix field emitters
    • Collins, P. G. and Zettl, A., "Unique characteristics of cold cathode carbon-nanotube-matrix field emitters, " Physical Review B 55, 9391 (1997).
    • (1997) Physical Review B , vol.55 , pp. 9391
    • Collins, P.G.1    Zettl, A.2
  • 23
    • 33746614852 scopus 로고    scopus 로고
    • In situ transmission electron microscopy investigation of the structural changes in carbon nanotubes during electron emission at high currents
    • Doytcheva, M., Kaiser, M., and de Jonge, N., "In situ transmission electron microscopy investigation of the structural changes in carbon nanotubes during electron emission at high currents, " Nanotechnology 17, 3226 (2006).
    • (2006) Nanotechnology , vol.17 , pp. 3226
    • Doytcheva, M.1    Kaiser, M.2    De Jonge, N.3
  • 26
    • 79958226945 scopus 로고    scopus 로고
    • On-chip vacuum microtriode using carbon nanotube field emitters
    • DOI 10.1063/1.1480884
    • Bower, C., Zhu, W., Shalom, D., Lopez, D., Chen, L. H., Gammel, P. L., and Jin, S., "On-chip vacuum microtriode using carbon nanotube field emitters, " Applied Physics Letters 80, 3820 (2002). (Pubitemid 34637272)
    • (2002) Applied Physics Letters , vol.80 , Issue.20 , pp. 3820
    • Bower, C.1    Zhu, W.2    Shalom, D.3    Lopez, D.4    Chen, L.H.5    Gammel, P.L.6    Jin, S.7
  • 27
    • 4544233318 scopus 로고    scopus 로고
    • A new masking technology for deep glass etching and its microfluidic application
    • Bu, M., Melvin, T., Ensell, G. J., Wilkinson, J. S., Evans, A. G. R., "A new masking technology for deep glass etching and its microfluidic application, " Sensors and Actuators 115, 476 (2004).
    • (2004) Sensors and Actuators , vol.115 , pp. 476
    • Bu, M.1    Melvin, T.2    Ensell, G.J.3    Wilkinson, J.S.4    Evans, A.G.R.5
  • 28
    • 69549094269 scopus 로고    scopus 로고
    • Due to electric field inhomogeneity, the electrons that are generated towards the edges of the cathode are defocused in the ionization region; they have been omitted in Figure 3 for clarity
    • Due to electric field inhomogeneity, the electrons that are generated towards the edges of the cathode are defocused in the ionization region; they have been omitted in Figure 3 for clarity.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.