-
1
-
-
35949004591
-
-
H H. B. Niemann, S. K. Atreya, S. J. Bauer, K. Biemann, B. Block, G. R. Carignan, T. M. Donahue, R. L. Frost, D. Gautier, J. A. Haberman, D. Harpold, D. M. Hunten, G. Isreal, J. I. Limine, K. Mauersberger, T. C. Owen, F. Raulin, J. E. Richards, S.H. Way, Space Science Reviews 104, 570 (2002).
-
(2002)
Space Science Reviews
, vol.104
, pp. 570
-
-
Niemann, H.H.B.1
Atreya, S.K.2
Bauer, S.J.3
Biemann, K.4
Block, B.5
Carignan, G.R.6
Donahue, T.M.7
Frost, R.L.8
Gautier, D.9
Haberman, J.A.10
Harpold, D.11
Hunten, D.M.12
Isreal, G.13
Limine, J.I.14
Mauersberger, K.15
Owen, T.C.16
Raulin, F.17
Richards, J.E.18
Way, S.H.19
-
2
-
-
0006784405
-
-
C. A. Spindt, I. Brodie, L. Humphrey, E. R. Westerberg, J. Appl. Phys. 47, 5428 (1976).
-
(1976)
J. Appl. Phys
, vol.47
, pp. 5428
-
-
Spindt, C.A.1
Brodie, I.2
Humphrey, L.3
Westerberg, E.R.4
-
4
-
-
11944268480
-
-
A. G. Rinzler, J. H. Hafner, P. Nikolaev, L. Lou, S. G. Kim, D. Tomanek, P. Nordlander, D. T. Colbert, and R. E. Smalley, Science 269, 1550 (1995).
-
(1995)
Science
, vol.269
, pp. 1550
-
-
Rinzler, A.G.1
Hafner, J.H.2
Nikolaev, P.3
Lou, L.4
Kim, S.G.5
Tomanek, D.6
Nordlander, P.7
Colbert, D.T.8
Smalley, R.E.9
-
5
-
-
0346377912
-
-
Yu. V. Gulyaev, L. A. Chernozatonskii, Ja. Kosakovskaja, N. I. Sinitsyn, G. V. Torgashov, and Yu. F. Zakharchenko, J. Vac. Sci. Technol. B 13, 435 (1995).
-
(1995)
J. Vac. Sci. Technol. B
, vol.13
, pp. 435
-
-
Gulyaev, Y.V.1
Chernozatonskii, L.A.2
Kosakovskaja, J.3
Sinitsyn, N.I.4
Torgashov, G.V.5
Zakharchenko, Y.F.6
-
8
-
-
5944246146
-
-
Q. H. Wang, T. D. Corrigan, J. Y. Dai, R. P. H. Chang, and A. R. Krauss, Appl. Phys. Lett. 70, 3308 (1997).
-
(1997)
Appl. Phys. Lett
, vol.70
, pp. 3308
-
-
Wang, Q.H.1
Corrigan, T.D.2
Dai, J.Y.3
Chang, R.P.H.4
Krauss, A.R.5
-
9
-
-
0000961126
-
-
J.-M. Bonard, J.-P. Salvetat, T. Stockli, W. A. de Heer, Laszlo Forro, and A. Chatelain, Appl. Phys. Lett. 73, 918 (1998).
-
(1998)
Appl. Phys. Lett
, vol.73
, pp. 918
-
-
Bonard, J.-M.1
Salvetat, J.-P.2
Stockli, T.3
de Heer, W.A.4
Forro, L.5
Chatelain, A.6
-
10
-
-
0032620880
-
-
W. Zhu, C. Bower, O. Zhou, G. Kochanski, and S. Jin, Appl. Phys. Lett. 75, 873 (1999).
-
(1999)
Appl. Phys. Lett
, vol.75
, pp. 873
-
-
Zhu, W.1
Bower, C.2
Zhou, O.3
Kochanski, G.4
Jin, S.5
-
11
-
-
0033593584
-
-
S. Fan, M. G. Chapline, N. R. Franklin, T. W. Tombler, A. M. Cassell, and H. Dai, Science 283, 512 (1999).
-
(1999)
Science
, vol.283
, pp. 512
-
-
Fan, S.1
Chapline, M.G.2
Franklin, N.R.3
Tombler, T.W.4
Cassell, A.M.5
Dai, H.6
-
13
-
-
0000609573
-
-
H. Murakami, M. Hirakawa, C. Tanaka, and H. Yamakawa, Appl. Phys. Lett. 76, 1776 (2000).
-
(2000)
Appl. Phys. Lett
, vol.76
, pp. 1776
-
-
Murakami, H.1
Hirakawa, M.2
Tanaka, C.3
Yamakawa, H.4
-
14
-
-
0001662947
-
-
A. M. Rao, D. Jacques, R. C. Haddon, W. Zhu, C. Bower, and S. Jin, Appl. Phys. Lett. 76, 3813 (2000).
-
(2000)
Appl. Phys. Lett
, vol.76
, pp. 3813
-
-
Rao, A.M.1
Jacques, D.2
Haddon, R.C.3
Zhu, W.4
Bower, C.5
Jin, S.6
-
15
-
-
0037017256
-
-
J. Cumings, A. Zettl, M. R. McCartney, and J. C. H. Spence, Phys. Rev. Lett. 88, 056804 (2002).
-
(2002)
Phys. Rev. Lett
, vol.88
, pp. 056804
-
-
Cumings, J.1
Zettl, A.2
McCartney, M.R.3
Spence, J.C.H.4
-
16
-
-
28144458568
-
-
E. Minoux, O. Groening, K. B. K. Teo, S. H. Dalal, L. Gangloff, J.-P. Schnell, L. Hudanski, I. Y. Y. Bu, P. Vincent, P. Legagneux, G. A. J. Amaratunga, and W. I. Milne, Nano Lett. 5, 2135 (2005).
-
(2005)
Nano Lett
, vol.5
, pp. 2135
-
-
Minoux, E.1
Groening, O.2
Teo, K.B.K.3
Dalal, S.H.4
Gangloff, L.5
Schnell, J.-P.6
Hudanski, L.7
Bu, I.Y.Y.8
Vincent, P.9
Legagneux, P.10
Amaratunga, G.A.J.11
Milne, W.I.12
-
18
-
-
79958226945
-
-
C. Bower, W. Zhu, D. Shalom, D. Lopez, L. H. Chen, P. L. Gammel, and S. Jin, Appl. Phys. Lett. 80, 3820 (2002).
-
(2002)
Appl. Phys. Lett
, vol.80
, pp. 3820
-
-
Bower, C.1
Zhu, W.2
Shalom, D.3
Lopez, D.4
Chen, L.H.5
Gammel, P.L.6
Jin, S.7
-
20
-
-
33646783310
-
-
W. I. Milne, K. B. K. Teo, M. Mann, I. Y. Y. Bu, G. A. J. Amaratunga, N. de Jonge, M. Allioux, J. T. Oostveen, P. Legagneux, E. Minoux, L. Gangloff, L. Hudanski, J.-P. Schnell, L. D. Dieumegard, F. Peauger, T. Wells, and M. El-Gomati, Phys. Stat. Sol. A 203, 1058 (2006).
-
(2006)
Phys. Stat. Sol. A
, vol.203
, pp. 1058
-
-
Milne, W.I.1
Teo, K.B.K.2
Mann, M.3
Bu, I.Y.Y.4
Amaratunga, G.A.J.5
de Jonge, N.6
Allioux, M.7
Oostveen, J.T.8
Legagneux, P.9
Minoux, E.10
Gangloff, L.11
Hudanski, L.12
Schnell, J.-P.13
Dieumegard, L.D.14
Peauger, F.15
Wells, T.16
El-Gomati, M.17
-
21
-
-
0000701797
-
-
V. H. Crespi, N. G. Chopra, M. L. Cohen, A. Zettl, and S. G. Louie, Phys. Rev. B 54, 5927 (1996).
-
(1996)
Phys. Rev. B
, vol.54
, pp. 5927
-
-
Crespi, V.H.1
Chopra, N.G.2
Cohen, M.L.3
Zettl, A.4
Louie, S.G.5
-
22
-
-
35948986969
-
-
SIMION 3D Ion and Electron Optics Simulator v8.0.2, Scientific Instrument Services, Inc., 1027 Old York Rd., Ringoes, NJ 08551, http://www.simion.com/ .
-
SIMION 3D Ion and Electron Optics Simulator v8.0.2, Scientific Instrument Services, Inc., 1027 Old York Rd., Ringoes, NJ 08551, http://www.simion.com/ .
-
-
-
-
24
-
-
35949004592
-
-
B. Vancil E Beam, Incorporated, Beaverton, OR
-
B. Vancil E Beam, Incorporated, Beaverton, OR.
-
-
-
-
25
-
-
0037030872
-
-
L. Delzeit, C. V. Nguyen, B. Chen, R. Stevens, A. Cassell, J. Han, and M. Meyyappan, J. Phys. Chem. B 106, 5629 (2002).
-
(2002)
J. Phys. Chem. B
, vol.106
, pp. 5629
-
-
Delzeit, L.1
Nguyen, C.V.2
Chen, B.3
Stevens, R.4
Cassell, A.5
Han, J.6
Meyyappan, M.7
-
26
-
-
84858462658
-
-
It should be emphasized that, owing to the transmission area of the as-built apertures, the measured current at the anode is a small fraction of the total emission current produced by the filament. In previous measurements on this and similar filaments, total emission current was found to be in excess of 400 μA at 210 mW
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It should be emphasized that, owing to the transmission area of the as-built apertures, the measured current at the anode is a small fraction of the total emission current produced by the filament. In previous measurements on this and similar filaments, total emission current was found to be in excess of 400 μA at 210 mW.
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