In situ transmission electron microscopy investigation of the structural changes in carbon nanotubes during electron emission at high currents

Nanotechnology

Volumn 17, Issue 13, 2006, Pages 3226-3233

  Doytcheva, Maya ^a,c   Kaiser, Monja ^a   De Jonge, Niels ^b  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

^c ASML   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON NANOTUBES; DEGRADATION; ELECTRIC CURRENTS; ELECTRON EMISSION;

ELECTRON EMISSION CONDITIONS; MULTI-WALLED CARBON NANOTUBES; SHARP METAL TIPS; THRESHOLD CURRENT;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 33746614852     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/17/13/025     Document Type: Article

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