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Nanostructured Materials

Volumn 10, Issue 3, 1998, Pages 357-363

Crystallite size distributions and lattice defects in R.F. sputtered nanograin TiO2 and SnO2 films

(2) Rickerby, D G a Horrillo, M C a

a JOINT RESEARCH CENTRE (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CONDENSATION; CRYSTAL LATTICES; GRAIN SIZE AND SHAPE; INERT GASES; PARTICLE SIZE ANALYSIS; POINT DEFECTS; SPUTTERING; STOICHIOMETRY; THIN FILMS; TIN COMPOUNDS; TITANIUM DIOXIDE; TRANSMISSION ELECTRON MICROSCOPY;

CRYSTALLITE SIZE DISTRIBUTION; GRAIN SIZE DISTRIBUTION; INERT GAS CONDENSATION TECHNIQUE; RADIO FREQUENCY SPUTTERING;

NANOSTRUCTURED MATERIALS;

EID: 0032035948 PISSN: 09659773 EISSN: None Source Type: Journal
DOI: 10.1016/S0965-9773(98)00076-2 Document Type: Article

Times cited : (18)

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