Reliability analysis of InGaN Blu-Ray laser diode

Microelectronics Reliability

Volumn 49, Issue 9-11, 2009, Pages 1236-1239

  Trivellin, Nicola ^a   Meneghini, Matteo ^a   Meneghesso, Gaudenzio ^a   Zanoni, Enrico ^a   Orita, Kenji ^b   Yuri, Masaaki ^b   Tanaka, Tsuyoshi ^b   Ueda, Daisuke ^b  

^a UNIVERSITY OF PADOVA   (Italy)

^b PANASONIC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATING FACTORS; AGEING TREATMENTS; BLU-RAY; DEGRADATION RATE; INGAN LASER DIODES; LASER DIODES; LINEAR CORRELATION; NON-RADIATIVE LIFETIMES; RELIABILITY TEST; SLOPE EFFICIENCIES; STRESS CURRENT; STRESS TEMPERATURE; THERMAL STORAGE; THRESHOLD CURRENTS;

DEGRADATION; HEAT STORAGE; LADDER NETWORKS; QUALITY ASSURANCE;

RELIABILITY ANALYSIS;

EID: 69249202295     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2009.07.002     Document Type: Article

References (10)

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