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Volumn 4, Issue 8, 2009, Pages 477-478
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Force microscopy: On the charge
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Author keywords
[No Author keywords available]
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Indexed keywords
NANOTECHNOLOGY;
FORCE MICROSCOPY;
NANOSTRUCTURED MATERIALS;
GOLD;
SILVER;
ATOMIC FORCE MICROSCOPY;
ELECTRIC POTENTIAL;
ELECTRICITY;
ELECTRON;
FORCE;
FRICTION;
MICROSCOPE;
PRIORITY JOURNAL;
SHORT SURVEY;
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EID: 68949170544
PISSN: 17483387
EISSN: 17483395
Source Type: Journal
DOI: 10.1038/nnano.2009.215 Document Type: Short Survey |
Times cited : (2)
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References (9)
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