Energy surfaces of rare-earth silicide films on Si(1 1 1)

Surface Science

Volumn 603, Issue 17, 2009, Pages 2808-2814

  Wanke, M ^a   Franz, M ^a   Vetterlein, M ^a   Pruskil, G ^a   Hopfner B ^a   Prohl, C ^a   Engelhardt, I ^a   Stojanov, P ^b   Huwald, E ^b   Riley, J D ^b   Dahne M ^a  

^a TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

^b LA TROBE UNIVERSITY   (Australia)

Author keywords

Angle resolved photoelectron spectroscopy; Lanthanides; Silicides; Silicon; Thin film structures

Indexed keywords

ANGLE-RESOLVED PHOTOELECTRON SPECTROSCOPY; ANISOTROPIC DISPERSION; ANISOTROPIC EFFECTIVE MASS; BAND FILLINGS; ELECTRON POCKETS; ENERGY SURFACE; LANTHANIDES; NUMBER OF ELECTRONS; RARE-EARTH SILICIDES; SI (1 1 1); SILICIDE LAYERS; SURFACE SENSITIVITY; SURFACE UNITS; THIN FILM STRUCTURES; TOROIDAL ANALYZER; ZONE FOLDING;

ANISOTROPY; CELL MEMBRANES; DYSPROSIUM; ELECTRONS; FILM PREPARATION; MONOLAYERS; PHOTOELECTRICITY; PHOTOIONIZATION; PHOTONS; SEMICONDUCTING SILICON COMPOUNDS; SILICIDES; SILICON; SURFACE STRUCTURE; THIN FILM DEVICES; THIN FILMS;

PHOTOELECTRON SPECTROSCOPY;

EID: 68949110313     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2009.07.026     Document Type: Article

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