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Volumn 600, Issue 3, 2006, Pages 755-761

Atomic structure of thin dysprosium-silicide layers on Si(1 1 1)

Author keywords

Lanthanides; Scanning tunneling microscopy; Silicides; Silicon; Thin film structures

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; DYSPROSIUM; MONOLAYERS; SCANNING TUNNELING MICROSCOPY; SILICON COMPOUNDS; SURFACE STRUCTURE; THICK FILMS;

EID: 31744436841     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2005.11.029     Document Type: Article
Times cited : (33)

References (25)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.