Athermalization in atomic force microscope based force spectroscopy using matched microstructure coupling

Review of Scientific Instruments

Volumn 80, Issue 7, 2009, Pages

  Torun, H ^a   Finkler, O ^a   Degertekin, F L ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; AFM PROBE; ATHERMALIZATION; ATOMIC FORCE MICROSCOPES; DIFFERENTIAL SIGNAL; FEED-BACK LOOP; FORCE LEVEL; FORCE SPECTROSCOPY; TEMPERATURE CHANGES; THERMAL DRIFTS;

ATOMIC SPECTROSCOPY; ATOMS; MICROSTRUCTURE; PROBES;

ATOMIC FORCE MICROSCOPY;

ARTICLE; ATOMIC FORCE MICROSCOPY; EQUIPMENT DESIGN; INSTRUMENTATION; METHODOLOGY; MICROTECHNOLOGY; SPECTROSCOPY; TEMPERATURE;

EQUIPMENT DESIGN; MICROSCOPY, ATOMIC FORCE; MICROTECHNOLOGY; SPECTRUM ANALYSIS; TEMPERATURE;

EID: 68949090172     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3167276     Document Type: Article

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