Atomic force microscopy with inherent disturbance suppression for nanostructure imaging

Nanotechnology

Volumn 17, Issue 6, 2006, Pages 1574-1579

  Sparks, A W ^a   Manalis, S R ^a,b  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^b Massachusetts Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC NOISE; ATOMIC FORCE MICROSCOPY; INTERFEROMETERS; NANOSTRUCTURED MATERIALS; REAL TIME SYSTEMS; TOPOLOGY;

MECHANICAL NOISE; REAL-TIME IMAGES; SCANNING PROBE IMAGING; TOPOGRAPHY;

IMAGING TECHNIQUES;

EID: 33645683349     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/17/6/007     Document Type: Article

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