Niobium coating of cavities using Cathodic Arc

IEEE Transactions on Applied Superconductivity

Volumn 19, Issue 3, 2009, Pages 1394-1398

  Russo, Roberto ^a   Catani, Luciano ^b   Cianchi, Alessandro ^b   DiGiovenale, Domenico ^b   Lorkiewicz, J ^b,c   Tazzari, Sergio ^b   Granata, Carmine ^a   Ventrella, Pierluigi ^d   Lamura, Gianrico ^e   Andreone, Antonello ^f  

^a CNR   (Italy)

^b UNIVERSITY OF ROME TOR VERGATA   (Italy)

^c SINS ^*  (Poland)

^d UNIVERSITY OF SANNIO   (Italy)

^e CNR   (Italy)

^f UNIVERSITY OF NAPLES FEDERICO II   (Italy)

Author keywords

Arc discharges; Multilayer; Superconducting cavity resonators; Thin films

Indexed keywords

ACCELERATING FIELDS; ARC DISCHARGES; CATHODIC ARC; CAVITY PERFORMANCE; CRITICAL FIELDS; DEPOSITION ANGLE; EXPERIMENTAL CHARACTERIZATION; HIGH QUALITY; LIMITING FACTORS; LONDON PENETRATION DEPTH; NB/ALOX/NB; NIOBIUM COATINGS; NIOBIUM THIN FILM; QUALITY FACTOR Q; RF CAVITIES; SINGLE CELLS; SUPERCONDUCTING ACCELERATOR; SUPERCONDUCTING CAVITY RESONATORS; SUPERCONDUCTING LAYER; SUPERCONDUCTING LAYER THICKNESS; SUPERCONDUCTING PROPERTIES;

CAVITY RESONATORS; CELL MEMBRANES; FILM PREPARATION; MICROWAVE DEVICES; MULTILAYER FILMS; MULTILAYERS; NIOBIUM; SUPERCONDUCTING DEVICES; SUPERCONDUCTIVITY; TECHNETIUM;

SUPERCONDUCTING FILMS;

EID: 68749101925     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2009.2019205     Document Type: Conference Paper

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