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Volumn 351, Issue 4, 2001, Pages 421-428

Study of the residual surface resistance of niobium films at 1.5 GHz

Author keywords

Residual resistance; RF cavities; Surface impedance; Thin films

Indexed keywords

ELECTRIC IMPEDANCE; ELECTRIC RESISTANCE; GRAIN SIZE AND SHAPE; HYDRIDES; METALLIC FILMS; MICROWAVES; NIOBIUM; OXIDATION; PRECIPITATION (CHEMICAL); SURFACE ROUGHNESS;

EID: 0035871731     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(00)01645-2     Document Type: Article
Times cited : (44)

References (30)
  • 21
    • 0005433542 scopus 로고
    • Ph.D. Dissertation, Cornell University, Ithaca, NY, USA
    • (1988)
    • Palmer, F.L.1
  • 27
    • 0005403675 scopus 로고    scopus 로고
    • Ph.D. Dissertation, Genova University, Italy
    • (1999)
    • Daccà,, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.