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Volumn 351, Issue 4, 2001, Pages 421-428
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Study of the residual surface resistance of niobium films at 1.5 GHz
a
CERN
(Switzerland)
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Author keywords
Residual resistance; RF cavities; Surface impedance; Thin films
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Indexed keywords
ELECTRIC IMPEDANCE;
ELECTRIC RESISTANCE;
GRAIN SIZE AND SHAPE;
HYDRIDES;
METALLIC FILMS;
MICROWAVES;
NIOBIUM;
OXIDATION;
PRECIPITATION (CHEMICAL);
SURFACE ROUGHNESS;
RESIDUAL SURFACE RESISTANCE;
SUPERCONDUCTING FILMS;
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EID: 0035871731
PISSN: 09214534
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-4534(00)01645-2 Document Type: Article |
Times cited : (44)
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References (30)
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