Fourier-ratio deconvolution and its Bayesian equivalent

Micron

Volumn 39, Issue 6, 2008, Pages 642-647

  Egerton, R F ^a,b   Wang, F ^b   Malac, M ^a,b   Moreno, M S ^c   Hofer, F ^d  

^a UNIVERSITY OF ALBERTA   (Canada)

^b NATIONAL RESEARCH COUNCIL CANADA   (Canada)

^c CENTRO ATÓMICO BARILOCHE   (Argentina)

^d GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

Bayesian sharpening; Deconvolution; EELS; Plural scattering; TEM

Indexed keywords

ARSENIC COMPOUNDS; BAYESIAN NETWORKS; CONVOLUTION; MATRIX ALGEBRA; SUBSTRATES;

BACKGROUND SUBTRACTION; BAYESIAN; ELECTRON ENERGIES; ENERGY LOSS SPECTRUM; ENERGY RESOLUTIONS; FOURIER; LOW LOSSES; MAXIMUM LIKELIHOOD (MLET); NUMBER OF ITERATIONS; RESOLUTION FUNCTION;

ELECTRON ENERGY LOSS SPECTROSCOPY;

ARTICLE; BAYES THEOREM; ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY FILTERED TRANSMISSION ELECTRON MICROSCOPY; FOURIER ANALYSIS; METHODOLOGY; SPECTROSCOPY;

BAYES THEOREM; FOURIER ANALYSIS; MICROSCOPY, ENERGY-FILTERING TRANSMISSION ELECTRON; SPECTROSCOPY, ELECTRON ENERGY-LOSS; SPECTRUM ANALYSIS;

EID: 48049098773     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2007.10.004     Document Type: Article

References (19)

1. Batson P.E., Johnson D.W., and Spence J.C.H. Resolution enhancement by deconvolution using a field emission source in electron energy loss spectroscopy. Ultramicroscopy 41 (1992) 137-145
2. Bolton J.P.R., and Chen M. Electron energy loss in multilayered slabs. J. Phys. Condens. Matter 7 (1995) 3373-3387
3. Egerton R.F. Electron Energy-Loss Spectroscopy in the Electron Microscope (1996), Plenum/Kluwer/Springer, New York
4. Egerton R.F. New techniques in electron energy-loss spectroscopy. Micron 34 (2003) 127-139
5. Egerton R.F., and Crozier P.A. The use of Fourier techniques in electron energy-loss spectroscopy. Scanning Electron Microscopy Supplement 2 (1988), Scanning Microscopy International, Chicago pp. 245-254
6. Egerton R.F., Qian H., and Malac M. Improving the energy resolution of X-ray and electron energy-loss spectra. Micron 37 (2006) 310-315
7. Egerton R.F., and Whelan M.J. The electron energy-loss spectrum and band structure of diamond. Phil. Mag. 30 (1974) 739-749
8. Filipponi A. Deconvolution of the lifetime broadening from X-ray absorption spectra of atomic and molecular species. J. Phys. B At. Mol. Opt. Phys. 33 (2000) 2835-2846
9. Fister T.T., Seidler G.T., Rehr J.J., Kas J.J., Elam W.T., Cross J.O., and Nagle K.P. Deconvolving instrumental and intrinsic broadening in excited state X-ray spectroscopies. Phys. Rev. B 75 (2007) 174106
10. Gloter A., Douiri A., Tence M., Imhoff D., and Colliex C. Improving energy resolution of EELS spectra: an alternative to the monochromator solution. Ultramicroscopy 96 (2003) 385-400
11. Howie A., and Walsh C. Interpretation of valence loss spectra from composite media. Microsc. Microanal. Microstruct. 2 (1991) 171-181
12. Ishizuka K., Kimoto K., and Bando Y. Improving energy resolution of EELS using maximum-entropy and Richardson-Lucy algorithms. Microscopy and Microanalysis 2003 (2003), Cambridge University Press 832-833CD
13. Johnson D.W., and Spence J.C.H. Determination of the single-scattering probability distribution from plural-scattering data. J. Phys. D (Appl. Phys.) 7 (1974) 771-780
14. Katterwe H. Object analysis by electron energy loss spectroscopy in the infra-red region. In: Cosslett V.E. (Ed). Electron Microscopy-1972 (1972), The Institute of Physics, London 154-155
15. 23 ELNES with resolution-enhancement software and first-principles calculation. J. Electron Microsc. 36 (2003) 299-303
16. Lazar S., Botton G.A., and Zandbergen H.W. Enhancement of resolution in core-loss and low-loss spectroscopy in a monochromated microscope. Ultramicroscopy 106 (2006) 1091-1103
17. Overwijk M.H.F., and Reefman D. Maximum-entropy deconvolution applied to electron energy-loss spectroscopy. Micron 31 (2000) 325-331
18. Rafferty B., Pennycook S.J., and Brown L.M. Zero loss peak deconvolution for bandgap EEL spectra. J. Electron Microsc. 49 (2000) 517-524
19. Wang F., Malac M., and Egerton R.F. Alternative methods of identifying the oxidation of metallic nanoparticles embedded in a matrix. Micron 38 (2007) 371-376