메뉴 건너뛰기




Volumn 30, Issue 8, 2009, Pages 811-813

Low-resistance carbon nanotube contact plug to silicon

Author keywords

Carbon nanotube (CNT); Contacts; Interconnection; Plug

Indexed keywords

CNT TIP; CONTACT LAYERS; CONTACT RESISTIVITIES; CONTACTS; CROSS-BRIDGE; INTERCONNECTION; INTERMEDIATE LAYERS; LOW RESISTANCE; PLUG; SI MOSFET; TEST STRUCTURE; THERMAL BEHAVIORS; THERMAL STABILITY; TI SILICIDE;

EID: 68249149573     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2009.2024778     Document Type: Article
Times cited : (10)

References (20)
  • 1
    • 68249153999 scopus 로고    scopus 로고
    • Semicond. Ind. Assoc., International Technology Roadmap for Semiconductors, San Jose, CA, 2007.
    • Semicond. Ind. Assoc., International Technology Roadmap for Semiconductors, San Jose, CA, 2007.
  • 4
    • 33747038351 scopus 로고    scopus 로고
    • Electroless and electrolytic seed repair effects on damascene feature fill
    • T. Andryuschenko and J. Reid, "Electroless and electrolytic seed repair effects on damascene feature fill," in Proc. Int. Interconnect Technol. Conf., 2001, pp. 33-35.
    • (2001) Proc. Int. Interconnect Technol. Conf , pp. 33-35
    • Andryuschenko, T.1    Reid, J.2
  • 5
    • 0035920684 scopus 로고    scopus 로고
    • Reliability and current carrying capacity of carbon nanotubes
    • Aug
    • B. Q. Wei, R. Vajtai, and P. M. Ajayan, "Reliability and current carrying capacity of carbon nanotubes," Appl. Phys. Lett., vol. 79, no. 8, pp. 1172-1174, Aug. 2001.
    • (2001) Appl. Phys. Lett , vol.79 , Issue.8 , pp. 1172-1174
    • Wei, B.Q.1    Vajtai, R.2    Ajayan, P.M.3
  • 6
  • 7
    • 13444256520 scopus 로고    scopus 로고
    • Performance comparison between carbon nanotube and copper interconnects for gigascale integration (GSI)
    • Feb
    • A. Naeemi, R. Sarvari, and J. D. Meindl, "Performance comparison between carbon nanotube and copper interconnects for gigascale integration (GSI)," IEEE Electron Device Lett., vol. 26, no. 2, pp. 84-86, Feb. 2005.
    • (2005) IEEE Electron Device Lett , vol.26 , Issue.2 , pp. 84-86
    • Naeemi, A.1    Sarvari, R.2    Meindl, J.D.3
  • 8
    • 37549010257 scopus 로고    scopus 로고
    • Low temperature grown carbon nanotube interconnects using inner shells by chemical mechanical polishing
    • Dec
    • D. Yokoyama, T. Iwasaki, T. Yoshida, H. Kawarada, S. Sato, T. Hyakushima, M. Nihei, and Y. Awano, "Low temperature grown carbon nanotube interconnects using inner shells by chemical mechanical polishing," Appl. Phys. Lett., vol. 91, no. 26, p. 263 101, Dec. 2007.
    • (2007) Appl. Phys. Lett , vol.91 , Issue.26 , pp. 263-101
    • Yokoyama, D.1    Iwasaki, T.2    Yoshida, T.3    Kawarada, H.4    Sato, S.5    Hyakushima, T.6    Nihei, M.7    Awano, Y.8
  • 9
    • 37549003626 scopus 로고    scopus 로고
    • Conduction regime in innovative carbon nanotube via interconnect architectures
    • Dec
    • J. C. Coiffic, M. Fayolle, S. Maitrejean, L. Torres, and H. Le Poche, "Conduction regime in innovative carbon nanotube via interconnect architectures," Appl. Phys. Lett., vol. 91, no. 25, p. 252 107, Dec. 2007.
    • (2007) Appl. Phys. Lett , vol.91 , Issue.25 , pp. 252-107
    • Coiffic, J.C.1    Fayolle, M.2    Maitrejean, S.3    Torres, L.4    Le Poche, H.5
  • 11
    • 40449094185 scopus 로고    scopus 로고
    • A 1 GHz integrated circuit with carbon nanotube interconnects and Si transistors
    • Feb
    • G. F. Close, S. Yasuda, B. Paul, S. Fujita, and H. S. P. Wong, "A 1 GHz integrated circuit with carbon nanotube interconnects and Si transistors," Nano Lett., vol. 8, no. 2, pp. 706-709, Feb. 2008.
    • (2008) Nano Lett , vol.8 , Issue.2 , pp. 706-709
    • Close, G.F.1    Yasuda, S.2    Paul, B.3    Fujita, S.4    Wong, H.S.P.5
  • 12
    • 50649088449 scopus 로고    scopus 로고
    • Electromigration studies of Cu/carbon nanotube composite interconnects using Blech structure
    • Sep
    • Y. Chai, P. C. H. Chan, Y. Y. Fu, Y. C. Chuang, and C. Y. Liu, "Electromigration studies of Cu/carbon nanotube composite interconnects using Blech structure," IEEE Electron Device Lett., vol. 29, no. 9, pp. 1001-1003, Sep. 2008.
    • (2008) IEEE Electron Device Lett , vol.29 , Issue.9 , pp. 1001-1003
    • Chai, Y.1    Chan, P.C.H.2    Fu, Y.Y.3    Chuang, Y.C.4    Liu, C.Y.5
  • 14
    • 79956045900 scopus 로고    scopus 로고
    • Low resistivity TiSi2 on narrow p(+) polycrystalline silicon lines
    • Jul
    • S. B. Herner and M. A. Vyvoda, "Low resistivity TiSi2 on narrow p(+) polycrystalline silicon lines," Appl. Phys. Lett., vol. 81, no. 2, pp. 259-261, Jul. 2002.
    • (2002) Appl. Phys. Lett , vol.81 , Issue.2 , pp. 259-261
    • Herner, S.B.1    Vyvoda, M.A.2
  • 15
    • 30344478566 scopus 로고    scopus 로고
    • J. F. AuBuchon, C. Daraio, L. H. Chen, A. I. Gapin, and S. H. Jin, Iron silicide root formation in carbon nanotubes grown by microwave PECVD, J. Phys. Chem. B, 109, no. 51, pp. 24 215-24 219, Dec. 2005.
    • J. F. AuBuchon, C. Daraio, L. H. Chen, A. I. Gapin, and S. H. Jin, "Iron silicide root formation in carbon nanotubes grown by microwave PECVD," J. Phys. Chem. B, vol. 109, no. 51, pp. 24 215-24 219, Dec. 2005.
  • 16
    • 33846821967 scopus 로고    scopus 로고
    • Carbon nanotube catalysis by metal silicide: Resolving inhibition versus growth
    • Jan
    • S. Esconjauregui, C. M. Whelan, and K. Maex, "Carbon nanotube catalysis by metal silicide: Resolving inhibition versus growth," Nanotechnology, vol. 18, no. 1, p. 015 602, Jan. 2007.
    • (2007) Nanotechnology , vol.18 , Issue.1 , pp. 015-602
    • Esconjauregui, S.1    Whelan, C.M.2    Maex, K.3
  • 17
    • 34250624156 scopus 로고    scopus 로고
    • Controlled termination of the growth of vertically aligned carbon nanotube arrays
    • K. Liu, K. L. Jiang, Y. Wei, S. P. Ge, P. Liu, and S. S. Fan, "Controlled termination of the growth of vertically aligned carbon nanotube arrays," Adv. Mater., vol. 19, no. 7, pp. 975-978, 2007.
    • (2007) Adv. Mater , vol.19 , Issue.7 , pp. 975-978
    • Liu, K.1    Jiang, K.L.2    Wei, Y.3    Ge, S.P.4    Liu, P.5    Fan, S.S.6
  • 18
    • 0039190155 scopus 로고    scopus 로고
    • Modeling of electronic transport in scanning tunneling microscope tip-carbon nanotube systems
    • Mar
    • T. Yamada, "Modeling of electronic transport in scanning tunneling microscope tip-carbon nanotube systems," Appl. Phys. Lett., vol. 78, no. 12, pp. 1739-1741, Mar. 2001.
    • (2001) Appl. Phys. Lett , vol.78 , Issue.12 , pp. 1739-1741
    • Yamada, T.1
  • 19
    • 0038636225 scopus 로고    scopus 로고
    • Focused ion beam prepared contacts of W to Si characterized by a cross-bridge Kelvin resistor approach
    • May
    • H. Langfischer and E. Bertagnolli, "Focused ion beam prepared contacts of W to Si characterized by a cross-bridge Kelvin resistor approach," J. Appl. Phys., vol. 93, no. 9, pp. 5827-5829, May 2003.
    • (2003) J. Appl. Phys , vol.93 , Issue.9 , pp. 5827-5829
    • Langfischer, H.1    Bertagnolli, E.2
  • 20
    • 0025403213 scopus 로고
    • Tungsten plug technology using substitution of W for Si
    • Mar
    • N. Kobay, M. Suzuki, and M. Saitou, "Tungsten plug technology using substitution of W for Si," IEEE Trans. Electron Devices, vol. 37, no. 3, pp. 577-582, Mar. 1990.
    • (1990) IEEE Trans. Electron Devices , vol.37 , Issue.3 , pp. 577-582
    • Kobay, N.1    Suzuki, M.2    Saitou, M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.