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Volumn 91, Issue 25, 2007, Pages

Conduction regime in innovative carbon nanotube via interconnect architectures

Author keywords

[No Author keywords available]

Indexed keywords

BIAS VOLTAGE; ELECTRIC POWER SYSTEM INTERCONNECTION; ELECTRIC PROPERTIES; ELECTRIC RESISTANCE MEASUREMENT;

EID: 37549003626     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2826274     Document Type: Article
Times cited : (34)

References (16)
  • 1
    • 37549063735 scopus 로고    scopus 로고
    • International Technology Roadmafor Semiconductors
    • International Technology Roadmap for Semiconductors (http://public.itrs. net/).
  • 8
    • 34748917181 scopus 로고    scopus 로고
    • Proceedings of the IEEE, International Interconnect Technology Conference IITC, Piscataway, NJ
    • H. Cho, K. H. Koo, P. Kapur, and K. C. Saraswat, Proceedings of the IEEE, International Interconnect Technology Conference IITC, Piscataway, NJ, 2007 (unpublished), p. 135.
    • (2007) , pp. 135
    • Cho, H.1    Koo, K.H.2    Kapur, P.3    Saraswat, K.C.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.