Structural evolution in annealing of layered C-Cu composite films

Powder Metallurgy and Metal Ceramics

Volumn 48, Issue 1-2, 2009, Pages 93-99

  Onoprienko, A A ^a   Danilenko, N I ^a  

^a FRANTSEVICH INSTITUTE FOR PROBLEMS OF MATERIALS SCIENCE   (Ukraine)

Author keywords

Amorphous carbon; Diffusion coalescence; Electron diffraction; Film; Structure; Transmission electron microscopy

Indexed keywords

CARBON LAYERS; CARBON SUBSTRATES; COPPER LAYER; COPPER PARTICLES; ENSEMBLE AVERAGES; IN-VACUUM; LAYERED FILMS; STRUCTURAL EVOLUTION; STRUCTURAL FEATURE; STRUCTURE; THREE-LAYER; THREE-LAYER FILM; TWO LAYERS; TWO-LAYER FILMS;

AMORPHOUS CARBON; AMORPHOUS FILMS; ANNEALING; COALESCENCE; COMPOSITE FILMS; COPPER; DIFFUSION; ELECTRON DIFFRACTION; ELECTRON MICROSCOPES; ELECTRONS; LIGHT TRANSMISSION; TRANSMISSION ELECTRON MICROSCOPY;

CARBON FILMS;

EID: 68149099013     PISSN: 10681302     EISSN: 15739066     Source Type: Journal    
DOI: 10.1007/s11106-009-9089-8     Document Type: Article

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