In situ measurements of stress with temperature in thin film Pb xBa1-xTiO3

Integrated Ferroelectrics

Volumn 83, Issue 1, 2006, Pages 155-164

  Boyd, D A ^a   El Naggar, M Y ^a   Goodwin, D G ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

CGS; Coherent gradient sensing; Ferroelectrics; Film stress; Polydomain structures; Stress relaxation; Thin films

Indexed keywords

EID: 67651246710     PISSN: 10584587     EISSN: 16078489     Source Type: Journal    
DOI: 10.1080/10584580600950822     Document Type: Conference Paper

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