Nanostructure and optical properties of CeO2 thin films obtained by plasma-enhanced chemical vapor deposition

Materials Science and Engineering C

Volumn 23, Issue 6-8, 2003, Pages 1013-1016

  Barreca, D ^a   Bruno, G ^b   Gasparotto, A ^a   Losurdo, M ^b   Tondello, E ^a  

^a UNIVERSITY OF PADOVA   (Italy)

^b CNR   (Italy)

Author keywords

CeO2; Nanostructured films; Optical properties; Spectroscopic Ellipsometry

Indexed keywords

CHEMICAL VAPOR DEPOSITION; ELLIPSOMETRY; SUBSTRATES; SURFACE ROUGHNESS; SYNTHESIS (CHEMICAL); THERMAL EFFECTS; THIN FILMS;

PHOTON ENERGY;

CERIUM COMPOUNDS;

NANOTECHNOLOGY;

EID: 0345550286     PISSN: 09284931     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msec.2003.09.103     Document Type: Article

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