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Volumn 496, Issue 2, 2006, Pages 371-375

Substrate temperature dependent morphology and resistivity of pulsed laser deposited iridium oxide thin films

Author keywords

Iridium oxide; Pulsed laser deposition; Resistivity; Scanning electron microscopy

Indexed keywords

ELECTRIC CONDUCTIVITY; MORPHOLOGY; POLYCRYSTALLINE MATERIALS; PULSED LASER DEPOSITION; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; THERMAL EFFECTS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EID: 28044460540     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.09.076     Document Type: Article
Times cited : (19)

References (20)
  • 12
    • 0003495856 scopus 로고
    • Joint Committee on Powder Diffraction Standard, North Dakoda State University, USA Card 34-0122
    • Powder diffraction file, Joint Committee on Powder Diffraction Standard, North Dakoda State University, USA, 1982, Card 34-0122.
    • (1982) Powder Diffraction File


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.