Dielectric properties and electronic transitions of porous and nanostructured cerium oxide films

Materials Science and Engineering: B

Volumn 109, Issue 1-3, 2004, Pages 69-73

  Logothetidis, S ^a   Patsalas, P ^a   Evangelou, E K ^b   Konofaos, N ^c   Tsiaoussis, I ^a   Frangis, N ^a  

^a ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

^b UNIVERSITY OF IOANNINA   (Greece)

^c UNIVERSITY OF PATRAS   (Greece)

Author keywords

Cerium oxide films; Dielectric properties; Electronic transitions

Indexed keywords

ELECTRON BEAMS; ELECTRON TRANSITIONS; ELLIPSOMETRY; EVAPORATION; FILM GROWTH; GRAIN SIZE AND SHAPE; HIGH RESOLUTION ELECTRON MICROSCOPY; ION BEAM ASSISTED DEPOSITION; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; PERMITTIVITY; POROUS MATERIALS; REFRACTIVE INDEX; TRANSMISSION ELECTRON MICROSCOPY; TRANSPARENCY;

CERIUM OXIDE FILMS; ELECTRON BEAM EVAPORATION (EBE); OXYGEN VACANCIES; SPECTROSCOPIC ELLIPSOMETRY (SE);

CERIUM COMPOUNDS;

EID: 2342567060     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2003.10.048     Document Type: Conference Paper

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