Optical and structural characterization of r.f. sputtered CeO2 thin films

Journal of Materials Science

Volumn 32, Issue 7, 1997, Pages 1861-1865

  Bueno, R M ^a   Martinez Duart, J M ^a   Hernández Vélez, Manuel ^b   Vazquez L ^c  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^b ISP EJ Varona   (Cuba)

^c INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; ENERGY GAP; GRAIN SIZE AND SHAPE; LIGHT EXTINCTION; REFLECTOMETERS; REFRACTIVE INDEX; SPUTTER DEPOSITION; SUBSTRATES; SURFACE ROUGHNESS; THERMAL EFFECTS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EXTINCTION COEFFICIENT; SCANNING FORCE MICROSCOPY;

CERIUM COMPOUNDS;

EID: 0031124684     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1018509007844     Document Type: Article

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