Williamson-Hall anisotropy in nanocrystalline metals: X-ray diffraction experiments and atomistic simulations

Acta Materialia

Volumn 56, Issue 2, 2008, Pages 165-176

  Brandstetter, S ^a   Derlet, P M ^a   Van Petegem, S ^a   Van Swygenhoven, H ^a  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

Molecular dynamics; Nanocrystalline materials; X ray diffraction (XRD)

Indexed keywords

ELECTRODEPOSITION; GRAIN SIZE AND SHAPE; MAGNETOCRYSTALLINE ANISOTROPY; MOLECULAR DYNAMICS; X RAY DIFFRACTION;

ATOMISTIC SIMULATIONS; ROOT-MEAN-SQUARE STRAIN; WILLIAMSON-HALL ANISOTROPY; X-RAY EXPERIMENTS;

NANOCRYSTALLINE MATERIALS;

EID: 37149050553     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2007.09.007     Document Type: Article

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