Infrared and photoelectron spectroscopy study of vapor phase deposited poly (3-hexylthiophene)

Applied Surface Science

Volumn 255, Issue 20, 2009, Pages 8593-8597

  Wei, Haoyan ^a   Scudiero, L ^b   Eilers, Hergen ^a  

^a WASHINGTON STATE UNIVERSITY   (United States)

^b Washington State University   (United States)

Author keywords

Infrared spectroscopy; Photoelectron spectroscopy; Polythiophene; Silver; Vapor phase deposition

Indexed keywords

BINDING ENERGY; CARRIER MOBILITY; FILM THICKNESS; INFRARED SPECTROSCOPY; INTERFACES (MATERIALS); PHOTOELECTRON SPECTROSCOPY; PHOTOELECTRONS; PHOTONS; POLYMERS; SILVER; THERMAL EVAPORATION; THIN FILMS; ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY; VACUUM EVAPORATION; VALENCE BANDS; VAPOR DEPOSITION;

FREE SURFACES; FRONTIER ORBITALS; POLY-3-HEXYLTHIOPHENE; POLYCRYSTALLINE SILVER; POLYMER/METAL INTERFACES; SECONDARY ELECTRONS; VALENCE-BAND MAXIMUMS; VAPOR PHASE DEPOSITION;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 67650490193     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2009.06.031     Document Type: Article

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