Microstructure and electrical properties of Ba 0.5 Sr 0.5 TiO 3 thin films prepared on copper foils with La 2 O 3 buffer layers

Applied Surface Science

Volumn 255, Issue 20, 2009, Pages 8319-8323

  Fan, Yanhua ^a,c   Yu, Shuhui ^b   Sun, Rong ^b   Li, Lei ^b   Du, Ruxu ^b   Yin, Yansheng ^a,c  

^a SHANGHAI MARITIME UNIVERSITY   (China)

^b SHENZHEN INSTITUTES OF ADVANCED TECHNOLOGY   (China)

^c OCEAN UNIVERSITY OF CHINA   (China)

Author keywords

Diffusion; Electrical properties; La 2 O 3 buffer layer; Sol gel growth; Thin films

Indexed keywords

BARIUM COMPOUNDS; BUFFER LAYERS; COPPER; DIFFUSION; ELECTRIC PROPERTIES; LANTHANUM OXIDES; METAL CLADDING; MICROSTRUCTURE; OPTICAL WAVEGUIDES; PEROVSKITE; SOL-GEL PROCESS; SOL-GELS; STRONTIUM COMPOUNDS;

BA0.5SR0.5TIO3; BST THIN FILMS; CRYSTALLIZABILITY; ELECTRIC BEHAVIOR; INERT ATMOSPHERES; PEROVSKITE FILMS; SOL-GEL GROWTH; SUBSTRATE OXIDATION;

THIN FILMS;

EID: 67650485537     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2009.05.041     Document Type: Article

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